RT

Randhir P. S. Thakur

Micron: 249 patents #21 of 6,345Top 1%
Applied Materials: 31 patents #353 of 7,310Top 5%
SG Steag Rtp Systems Gmbh: 5 patents #1 of 43Top 3%
MT Mattson Technology: 2 patents #87 of 230Top 40%
S3 Sandisk 3D: 1 patents #139 of 180Top 80%
📍 Fremont, CA: #5 of 9,298 inventorsTop 1%
🗺 California: #251 of 386,348 inventorsTop 1%
Overall (All Time): #1,402 of 4,157,543Top 1%
292
Patents All Time

Issued Patents All Time

Showing 176–200 of 292 patents

Patent #TitleCo-InventorsDate
6214707 Method of forming a doped region in a semiconductor substrate Howard E. Rhodes 2001-04-10
6207587 Method for forming a dielectric Li Li, Richard C. Hawthorne 2001-03-27
6204142 Methods to form electronic devices 2001-03-20
6204196 Method of forming a film having enhanced reflow characteristics at low thermal budget Gurtej S. Sandhu 2001-03-20
6200023 Method for determining the temperature in a thermal processing chamber Sing-Pin Tay, Yao Zhi Hu 2001-03-13
6195163 Reflectance method for evaluating the surface characteristics of opaque materials Michael Nuttall, J. Brett Rolfson, Robert Burke 2001-02-27
6194327 Rapid thermal etch and rapid thermal oxidation Fernando Gonzalez 2001-02-27
6194264 Semiconductor processing method of making a hemispherical grain (HSG) polysilicon layer Er-Xang Ping 2001-02-27
6191443 Capacitors, methods of forming capacitors, and DRAM memory cells Husam N. Al-Shareef, Scott DeBoer, F. Daniel Gealy 2001-02-20
6190992 Method to achieve rough silicon surface on both sides of container for enhanced capacitance/area electrodes Gurtej S. Sandhu 2001-02-20
6187628 Semiconductor processing method of forming hemispherical grain polysilicon and a substrate having a hemispherical grain polysilicon layer Michael Nuttall, John K. Zahurak, John P. Friedenreich 2001-02-13
6180481 Barrier layer fabrication methods Scott DeBoer 2001-01-30
6174651 Method for depositing atomized materials onto a substrate utilizing light exposure for heating 2001-01-16
6174806 High pressure anneals of integrated circuit structures John K. Zahurak 2001-01-16
6171872 Method of monitoring a process of manufacturing a semiconductor wafer including hemispherical grain polysilicon Tyler Lowrey, Klaus Schuegraf 2001-01-09
6165833 Semiconductor processing method of forming a capacitor Kunal R. Parekh 2000-12-26
6162744 Method of forming capacitors having high-K oxygen containing capacitor dielectric layers, method of processing high-K oxygen containing dielectric layers, method of forming a DRAM cell having having high-K oxygen containing capacitor dielectric layers Husam N. Al-Shareef, Scott DeBoer 2000-12-19
6162666 Method to form a DRAM capacitor using low temperature reoxidation Brett Rolfson 2000-12-19
6160285 Polysilicon electrode with increased surface area and method for making same Klaus F. Schugraf 2000-12-12
6159828 Semiconductor processing method of providing a doped polysilicon layer Er-Xang Ping 2000-12-12
6150265 Apparatus for forming materials 2000-11-21
6150706 Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer Garry Mercaldi, Michael Nuttall 2000-11-21
6150208 DRAM capacitors made from silicon-germanium and electrode-limited conduction dielectric films Scott DeBoer, Klaus Schuegraf, Ronald A. Weimer 2000-11-21
6150029 Method of forming a film having enhanced reflow characteristics at low thermal budget Gurtej S. Sandhu 2000-11-21
6146967 Selective deposition of amorphous silicon film seeded in a chlorine gas and a hydride gas ambient when forming a stacked capacitor with HSG James Pan 2000-11-14