RT

Randhir P. S. Thakur

Micron: 249 patents #21 of 6,345Top 1%
Applied Materials: 31 patents #353 of 7,310Top 5%
SG Steag Rtp Systems Gmbh: 5 patents #1 of 43Top 3%
MT Mattson Technology: 2 patents #87 of 230Top 40%
S3 Sandisk 3D: 1 patents #139 of 180Top 80%
📍 Fremont, CA: #5 of 9,298 inventorsTop 1%
🗺 California: #251 of 386,348 inventorsTop 1%
Overall (All Time): #1,402 of 4,157,543Top 1%
292
Patents All Time

Issued Patents All Time

Showing 151–175 of 292 patents

Patent #TitleCo-InventorsDate
6325017 Apparatus for forming a high dielectric film Scott DeBoer 2001-12-04
6316308 Methods to form electronic devices 2001-11-13
6316372 Methods of forming a layer of silicon nitride in a semiconductor fabrication process Scott DeBoer, John T. Moore, Mark Fischer 2001-11-13
6316800 Boride electrodes and barriers for cell dielectrics Husam N. Al-Shareef, Scott DeBoer, Dan Gealy 2001-11-13
6300243 Refractory metal roughness reduction using high temperature anneal in hydrides or organo-silane ambients 2001-10-09
6298470 Method for efficient manufacturing of integrated circuits Lyle Breiner 2001-10-02
6294461 Structure for contact formation using a silicon-germanium alloy 2001-09-25
6291868 Forming a conductive structure in a semiconductor device Ronald A. Weimer, Yongjun Jeff Hu, Pai-Hung Pan, Deepa Ratakonda, James A. Beck 2001-09-18
6291364 Method and apparatus for stabilizing high pressure oxidation of a semiconductor device F. Daniel Gealy, Dave Chapek, Scott DeBoer, Husam N. Al-Shareef 2001-09-18
6281141 Process for forming thin dielectric layers in semiconductor devices John H. Das 2001-08-28
6281122 Method for forming materials 2001-08-28
6282080 Semiconductor circuit components and capacitors Scott DeBoer, F. Daniel Gealy 2001-08-28
6281543 Double layer electrode and barrier system on hemispherical grain silicon for use with high dielectric constant materials and methods for fabricating the same Husam N. Al-Shareef, Scott DeBoer 2001-08-28
6281511 Apparatus for forming materials 2001-08-28
6275292 Reflectance method for evaluating the surface characteristics of opaque materials Michael Nuttall, J. Brett Rolfson, Robert Burke 2001-08-14
6271152 Method for forming oxide using high pressure David L. Chapek 2001-08-07
6262485 Using implants to lower anneal temperatures Michael Nuttall 2001-07-17
6255159 Method to form hemispherical grained polysilicon 2001-07-03
6255186 Methods of forming integrated circuitry and capacitors having a capacitor electrode having a base and a pair of walls projecting upwardly therefrom Husam N. Al-Shareef, Scott J. DeBoer 2001-07-03
6251720 High pressure reoxidation/anneal of high dielectric constant materials Scott DeBoer 2001-06-26
6249019 Container capacitor with increased surface area and method for making same Gurtej S. Sandhu 2001-06-19
6239459 Capacitors, methods of forming capacitors and integrated circuitry Husam N. Al-Shareef, Scott J. DeBoer 2001-05-29
6225157 Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer Garry Mercaldi, Michael Nuttall 2001-05-01
6222222 Methods of forming capacitors and related integrated circuitry Scott DeBoer, Klaus Schuegraf 2001-04-24
6217784 High selectivity etching process for oxides James Pan 2001-04-17