Issued Patents All Time
Showing 26–50 of 58 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11429481 | Restoring memory data integrity | Sarosh I. Azad, Wern-Yan Koe | 2022-08-30 |
| 11302589 | Electron beam probing techniques and related structures | Radhakrishna Kotti, Mallesh Rajashekharaiah | 2022-04-12 |
| 11290095 | Programmable dynamic clock stretch for at-speed debugging of integrated circuits | Niravkumar Patel | 2022-03-29 |
| 11263377 | Circuit architecture for expanded design for testability functionality | Albert Shih-Huai Lin, Partho Tapan Chaudhuri, Niravkumar Patel | 2022-03-01 |
| 11222695 | Socket design for a memory device | Radhakrishna Kotti, Rajasekhar Venigalla | 2022-01-11 |
| 11081203 | Leakage source detection by scanning access lines | Radhakrishna Kotti, Patrick Daniel White, Pavan Reddy K. Aella, Rajesh Kamana | 2021-08-03 |
| 11054461 | Test circuits for testing a die stack | Nui Chong, Cheang-Whang Chang, Henley Liu, Myongseob Kim, Albert Shih-Huai Lin | 2021-07-06 |
| 10872403 | System for predicting properties of structures, imager system, and related methods | Qianlan Liu, Pradeep Ramachandran, Shawn D. Lyonsmith, Steve K. McCandless, Ted Taylor +2 more | 2020-12-22 |
| 10754759 | Breakpointing circuitry that evaluates breakpoint conditions while running clock to target circuit | Georgios Tzimpragos, Jason Villarreal, Kumar Deepak, Jayashree Rangarajan | 2020-08-25 |
| 10756711 | Integrated circuit skew determination | Nui Chong | 2020-08-25 |
| 10672500 | Non-contact measurement of memory cell threshold voltage | Rajesh Kamana, Hongmei Wang, Shawn D. Lyonsmith, Ervin T. Hill, Zengtao T. Liu +1 more | 2020-06-02 |
| 10650891 | Non-contact electron beam probing techniques and related structures | Rajesh Kamana, Hongmei Wang, Shawn D. Lyonsmith, Ervin T. Hill, Zengtao T. Liu +1 more | 2020-05-12 |
| 10621067 | Data unit breakpointing circuits and methods | Georgios Tzimpragos, Jason Villarreal, Kumar Deepak, Yuxiong Zhu | 2020-04-14 |
| 10403359 | Non-contact electron beam probing techniques and related structures | Rajesh Kamana, Hongmei Wang, Shawn D. Lyonsmith, Ervin T. Hill, Zengtao T. Liu +1 more | 2019-09-03 |
| 10381101 | Non-contact measurement of memory cell threshold voltage | Rajesh Kamana, Hongmei Wang, Shawn D. Lyonsmith, Ervin T. Hill, Zengtao T. Liu +1 more | 2019-08-13 |
| 10110234 | Efficient system debug infrastructure for tiled architecture | Uma Durairajan, Subodh Kumar, Adam Elkins, Ghazaleh Mirjafari | 2018-10-23 |
| 9989572 | Method and apparatus for testing interposer dies prior to assembly | Raghunandan Chaware, Ganesh Hariharan | 2018-06-05 |
| 9865567 | Heterogeneous integration of integrated circuit device and companion device | Raghunandan Chaware, Ganesh Hariharan, Inderjit Singh, Glenn O'Rourke | 2018-01-09 |
| 9798352 | Circuits for and methods of implementing a design for testing and debugging with dual-edge clocking | Balakrishna Jayadev | 2017-10-24 |
| 9761533 | Interposer-less stack die interconnect | Raghunandan Chaware, Glenn O'Rourke, Inderjit Singh | 2017-09-12 |
| 9600018 | Clock stoppage in integrated circuits with multiple asynchronous clock domains | Balakrishna Jayadev, Ismed D. Hartanto | 2017-03-21 |
| 9500700 | Circuits for and methods of testing the operation of an input/output port | Xiaobao Wang, Burton M. Leary, Arvind Bomdica | 2016-11-22 |
| 9453870 | Testing for shorts between internal nodes of a power distribution grid | Richard W. Swanson, Anna Wing Wah Wong, Suraj Ethirajan, Asim A. Bajwa, Jongheon Jeong | 2016-09-27 |
| 8884804 | Time-to-digital conversion | Siva Charan Nimmagadda, Baanurathan Sadasivam, Richard W. Swanson, Yohan Frans | 2014-11-11 |
| 8407544 | Method and apparatus for AC scan testing with distributed capture and shift logic | Vasu P. Ganti | 2013-03-26 |