Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12167599 | Memory device including multiple decks of memory cells and pillars extending through the decks | Darwin A. Clampitt, Matthew J. King, Lisa M. Clampitt, John D. Hopkins, Kevin Y. Titus +5 more | 2024-12-10 |
| 11869178 | System for predicting properties of structures, imager system, and related methods | Amitava Majumdar, Qianlan Liu, Pradeep Ramachandran, Steve K. McCandless, Ted Taylor +2 more | 2024-01-09 |
| 11532638 | Memory device including multiple decks of memory cells and pillars extending through the decks | Darwin A. Clampitt, Matthew J. King, Lisa M. Clampitt, John D. Hopkins, Kevin Y. Titus +5 more | 2022-12-20 |
| 11508746 | Semiconductor device having a stack of data lines with conductive structures on both sides thereof | Darwin A. Clampitt, Roger W. Lindsay, Christopher R. Ritchie, Matthew J. King, Lisa M. Clampitt | 2022-11-22 |
| 10872403 | System for predicting properties of structures, imager system, and related methods | Amitava Majumdar, Qianlan Liu, Pradeep Ramachandran, Steve K. McCandless, Ted Taylor +2 more | 2020-12-22 |
| 10672500 | Non-contact measurement of memory cell threshold voltage | Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more | 2020-06-02 |
| 10650891 | Non-contact electron beam probing techniques and related structures | Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more | 2020-05-12 |
| 10403359 | Non-contact electron beam probing techniques and related structures | Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more | 2019-09-03 |
| 10381101 | Non-contact measurement of memory cell threshold voltage | Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more | 2019-08-13 |
| 8563435 | Method of reducing damage to an electron beam inspected semiconductor substrate, and methods of inspecting a semiconductor substrate | David Daycock, Paul A. Morgan, Curtis R. Olson | 2013-10-22 |
| 8334209 | Method of reducing electron beam damage on post W-CMP wafers | David Daycock, Paul A. Morgan, Curtis R. Olson | 2012-12-18 |
| 8026501 | Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging | Mark Williamson, Paul M. Johnson, Gurtej S. Sandhu, Justin R. Arrington | 2011-09-27 |
| 7791055 | Electron induced chemical etching/deposition for enhanced detection of surface defects | Mark Williamson, Paul M. Johnson, Gurtej S. Sandhu, Justin R. Arrington | 2010-09-07 |
| 6919612 | Biasable isolation regions using epitaxially grown silicon between the isolation regions | Darwin A. Clampitt, Regan Stanley Tsui | 2005-07-19 |
| 6716719 | Method of forming biasable isolation regions using epitaxially grown silicon between the isolation regions | Darwin A. Clampitt, Regan Stanley Tsui | 2004-04-06 |