Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8821682 | Electron induced chemical etching and deposition for local circuit repair | Mark Williamson, Gurtej S. Sandhu | 2014-09-02 |
| 8809074 | Method for integrated circuit diagnosis | Mark Williamson, Gurtej S. Sandhu | 2014-08-19 |
| 8609542 | Profiling solid state samples | Neal R. Rueger, Mark Williamson, Gurtej S. Sandhu | 2013-12-17 |
| 8389415 | Profiling solid state samples | Neal R. Rueger, Mark Williamson, Gurtej S. Sandhu | 2013-03-05 |
| 8026501 | Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging | Mark Williamson, Paul M. Johnson, Shawn D. Lyonsmith, Gurtej S. Sandhu | 2011-09-27 |
| 7892978 | Electron induced chemical etching for device level diagnosis | Mark Williamson, Gurtej S. Sandhu | 2011-02-22 |
| 7807062 | Electron induced chemical etching and deposition for local circuit repair | Mark Williamson, Gurtej S. Sandhu | 2010-10-05 |
| 7791055 | Electron induced chemical etching/deposition for enhanced detection of surface defects | Mark Williamson, Paul M. Johnson, Shawn D. Lyonsmith, Gurtej S. Sandhu | 2010-09-07 |
| 7791071 | Profiling solid state samples | Neal R. Rueger, Mark Williamson, Gurtej S. Sandhu | 2010-09-07 |
| 6819125 | Method and apparatus for integrated circuit failure analysis | James E. Green, Nicholas E. Paulin, Michael D. Kenney | 2004-11-16 |