Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11639962 | Scalable scan architecture for multi-circuit block arrays | Niravkumar Patel, Amitava Majumdar | 2023-05-02 |
| 11263377 | Circuit architecture for expanded design for testability functionality | Amitava Majumdar, Albert Shih-Huai Lin, Niravkumar Patel | 2022-03-01 |
| 10317464 | Dynamic scan chain reconfiguration in an integrated circuit | — | 2019-06-11 |
| 8738978 | Efficient wrapper cell design for scan testing of integrated | Ramesh C. Tekumalla, Priyesh Kumar, Komal Shah | 2014-05-27 |