SP

Sampath Purushothaman

IBM: 183 patents #194 of 70,183Top 1%
AM AMD: 2 patents #3,994 of 9,279Top 45%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
📍 Yorktown Heights, NY: #11 of 858 inventorsTop 2%
🗺 New York: #171 of 115,490 inventorsTop 1%
Overall (All Time): #3,902 of 4,157,543Top 1%
187
Patents All Time

Issued Patents All Time

Showing 1–25 of 187 patents

Patent #TitleCo-InventorsDate
11168234 Enhanced adhesive materials and processes for 3D applications James L. Hedrick, Robert D. Miller, Deborah A. Neumayer, Mary E. Rothwell, Willi Volksen +1 more 2021-11-09
10796958 3D integration method using SOI substrates and structures produced thereby Roy R. Yu 2020-10-06
10777454 3D integration method using SOI substrates and structures produced thereby Roy R. Yu 2020-09-15
10767084 Enhanced adhesive materials and processes for 3D applications James L. Hedrick, Robert D. Miller, Deborah A. Neumayer, Mary E. Rothwell, Willi Volksen +1 more 2020-09-08
10651086 3D integration method using SOI substrates and structures produced thereby Roy R. Yu 2020-05-12
10340182 Enhanced via fill material and processing for dual damscene integration James P. Doyle, Geraud Jean-Michel Dubois, Nicholas C. M. Fuller, Teddie Peregrino Magbitang, Robert D. Miller +1 more 2019-07-02
9994741 Enhanced adhesive materials and processes for 3D applications James L. Hedrick, Robert D. Miller, Deborah A. Neumayer, Mary E. Rothwell, Willi Volksen +1 more 2018-06-12
9412620 Three-dimensional integrated circuit device fabrication including wafer scale membrane Douglas C. La Tulipe, Jr., James Vichiconti 2016-08-09
9218956 Capping coating for 3D integration applications Anna W. Topol 2015-12-22
9111925 Process for enhanced 3D integration and structures generated using the same Evan G. Colgan, Roy R. Yu 2015-08-18
9089080 Corrugated interfaces for multilayered interconnects Lawrence A. Clevenger, Timothy J. Dalton, Elbert E. Huang, Carl Radens 2015-07-21
9064717 Lock and key through-via method for wafer level 3D integration and structures produced thereby Mary E. Rothwell, Ghavam G. Shahidi, Roy R. Yu 2015-06-23
8963278 Three-dimensional integrated circuit device using a wafer scale membrane Douglas C. La Tulipe, Jr., James Vichiconti 2015-02-24
8962448 Computer readable medium encoded with a program for fabricating 3D integrated circuit device using interface wafer as permanent carrier Mukta G. Farooq, Robert Hannon, Subramanian S. Iyer, Steven J. Koester, Fei Liu +2 more 2015-02-24
8927087 Bonding of substrates including metal-dielectric patterns with metal raised above dielectric and structures so formed Kuan-Neng Chen, Bruce K. Furman, David L. Rath, Anna W. Topol, Cornelia K. Tsang 2015-01-06
8912050 Capping coating for 3D integration applications Anna W. Topol 2014-12-16
8901741 Interconnect structures with engineered dielectrics with nanocolumnar porosity Matthew E. Colburn, Satya V. Nitta, Charles T. Black, Kathryn Guarini 2014-12-02
8828521 Corrugated interfaces for multilayered interconnects Lawrence A. Clevenger, Timothy J. Dalton, Elbert E. Huang, Carl Radens 2014-09-09
8778736 Capping coating for 3D integration applications Anna W. Topol 2014-07-15
8738167 3D integrated circuit device fabrication with precisely controllable substrate removal Mukta G. Farooq, Robert Hannon, Subramanian S. Iyer, Steven J. Koester, Roy R. Yu 2014-05-27
8664081 Method for fabricating 3D integrated circuit device using interface wafer as permanent carrier Mukta G. Farooq, Robert Hannon, Subramanian S. Iyer, Steven J. Koester, Fei Liu +2 more 2014-03-04
8637953 Wafer scale membrane for three-dimensional integrated circuit device fabrication Douglas C. La Tulipe, Jr., James Vichiconti 2014-01-28
8629553 3D integrated circuit device fabrication with precisely controllable substrate removal Mukta G. Farooq, Robert Hannon, Subramanian S. Iyer, Steven J. Koester, Roy R. Yu 2014-01-14
8623741 Homogeneous porous low dielectric constant materials Geraud Jean-Michel Dubois, Teddie Peregrino Magbitang, Willi Volksen, Theo J. Frot 2014-01-07
8617689 Bonding of substrates including metal-dielectric patterns with metal raised above dielectric and structures so formed Kuan-Neng Chen, Bruce K. Furman, David L. Rath, Anna W. Topol, Cornelia K. Tsang 2013-12-31