Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9134279 | Internal defect inspection method and apparatus for the same | Toshihiko Nakata, Tetsuya Matsui, Takehiro Tachizaki, Masahiro Watanabe | 2015-09-15 |
| 8035058 | Apparatus for repairing circuit pattern and method for manufacturing display apparatus using the same | Nobuaki Nakasu, Kaoru Yamada, Yuichiro Tanaka, Takeshi Arai, Hideyuki Honoki +2 more | 2011-10-11 |
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2011-05-31 |
| 7417444 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2008-08-26 |
| 7026830 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2006-04-11 |
| 6831998 | Inspection system for circuit patterns and a method thereof | Hiroya Koshishiba, Hideaki Doi, Mitsunobu Isobe, Haruomi Kobayashi, Chie Shishido | 2004-12-14 |
| 6559663 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2003-05-06 |
| 6329826 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-12-11 |
| 6172363 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2001-01-09 |
| 5883437 | Method and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereof | Shigenobu Maruyama, Mikio Hongo, Satoru Todoroki, Masaaki Okunaka, Hideo Matsuzaki +2 more | 1999-03-16 |
| 5781294 | Method and apparatus for detecting photoacoustic signal to detect surface and subsurface information of the specimen | Toshihiko Nakata, Takanori Ninomiya, Hilario Haruomi Kobayashi | 1998-07-14 |
| 5301248 | Method for pattern inspection and apparatus therefor | Ninomiya Takanori, Mineo Nomoto | 1994-04-05 |
| 4772125 | Apparatus and method for inspecting soldered portions | Takashi Hiroi, Takanori Ninomiya, Toshimitsu Hamada, Yasuo Nakagawa, Kohichi Karasaki | 1988-09-20 |
| 4556797 | Method and apparatus for detecting edge of fine pattern on specimen | Asahiro Kuni, Toshimitsu Hamada, Hiroshi Makihira | 1985-12-03 |