Issued Patents All Time
Showing 25 most recent of 46 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11760885 | Aluminum flake pigment and method of producing same | Tetsuya Fudaba, Koji Yoshida, Hiroki TAMAURA | 2023-09-19 |
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Yutaka Kaneko +12 more | 2011-05-31 |
| 7417444 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Yutaka Kaneko +12 more | 2008-08-26 |
| 7299741 | Hydraulic pressure actuator and continuous manual athletic device using the same | Kazuaki Hiramatsu, Makoto Konami, Yutaka Satoh, Taisuke Matsushita, Shigekazu Suzuki +2 more | 2007-11-27 |
| 7242015 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Yusuke Yajima, Hisaya Murakoshi, Masaki Hasegawa, Mari Nozoe +4 more | 2007-07-10 |
| 7026830 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Yutaka Kaneko +12 more | 2006-04-11 |
| 6979823 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Yusuke Yajima, Hisaya Murakoshi, Masaki Hasegawa, Mari Nozoe +4 more | 2005-12-27 |
| 6797954 | Patterned wafer inspection method and apparatus therefor | Hiroyuki Shinada, Yusuke Yajima, Hisaya Murakoshi, Masaki Hasegawa, Mari Nozoe +4 more | 2004-09-28 |
| 6559663 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Yutaka Kaneko +12 more | 2003-05-06 |
| 6518548 | Substrate temperature control system and method for controlling temperature of substrate | Masakazu Sugaya, Fumio Murai, Yutaka Kaneko, Masafumi Kanetomo, Shigeki Hirasawa +2 more | 2003-02-11 |
| 6511428 | Ultrasonic medical treating device | Takashi Azuma, Kenichi Kawabata, Shinichiro Umemura, Kazuaki Sasaki, Ryuichi Shinomura +3 more | 2003-01-28 |
| 6476390 | Method and apparatus for inspecting integrated circuit pattern using a plurality of charged particle beams | Hisaya Murakoshi, Yusuke Yajima, Hiroyuki Shinada, Mari Nozoe, Atsuko Takafuji +2 more | 2002-11-05 |
| 6394797 | Substrate temperature control system and method for controlling temperature of substrate | Masakazu Sugaya, Fumio Murai, Yutaka Kaneko, Masafumi Kanetomo, Shigeki Hirasawa +2 more | 2002-05-28 |
| 6329826 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Yutaka Kaneko +12 more | 2001-12-11 |
| 6172363 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Yutaka Kaneko +12 more | 2001-01-09 |
| 6114695 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 2000-09-05 |
| 6051834 | Electron microscope | Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Masanari Koguchi, Kazutaka Tsuji +7 more | 2000-04-18 |
| 5969357 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1999-10-19 |
| 5936244 | Electron microscope and electron microscopy method | Yusuke Yajima, Yoshio Takahashi, Hiroshi Suzuki | 1999-08-10 |
| 5877498 | Method and apparatus for X-ray analyses | Aritoshi Sugimoto, Yoshimi Sudo, Tokuo Kure, Ken Ninomiya, Takashi Nishida +3 more | 1999-03-02 |
| 5866905 | Electron microscope | Hiroshi Kakibayashi, Yasuhiro Mitsui, Hideo Todokoro, Masanari Koguchi, Kazutaka Tsuji +7 more | 1999-02-02 |
| 5866904 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1999-02-02 |
| 5838096 | Cathode having a reservoir and method of manufacturing the same | Hiroyuki Shinada, Satoru Fukuhara | 1998-11-17 |
| 5811819 | Electron beam source and its manufacturing method and electron beam source apparatus and electron beam apparatus using the same | Takashi Ohshima, Hiroyuki Shinada | 1998-09-22 |
| 5763880 | Cathode, electron beam emission apparatus using the same, and method of manufacturing the cathode | Hidetoshi Nisiyama, Masakuni Okamoto, Hiroyuki Shinada | 1998-06-09 |