GM

Glen L. Miles

IBM: 18 patents #6,125 of 70,183Top 9%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
Overall (All Time): #258,454 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8136084 Arranging through silicon vias in IC layout Donald R. Dean, Jr., Peter J. Lindgren, Edmund J. Sprogis, Anthony K. Stamper 2012-03-13
7714366 CMOS transistor with a polysilicon gate electrode having varying grain size Arne Ballantine, Kevin K. Chan, Jeffrey D. Gilbert, Kevin M. Houlihan, James J. Quinlivan +3 more 2010-05-11
6893948 Method of reducing polysilicon depletion in a polysilicon gate electrode by depositing polysilicon of varying grain size Arne Ballantine, Kevin K. Chan, Jeffrey D. Gilbert, Kevin M. Houlihan, James J. Quinlivan +3 more 2005-05-17
6853032 Structure and method for formation of a blocked silicide resistor Arne Ballantine, Donna K. Johnson 2005-02-08
6670263 Method of reducing polysilicon depletion in a polysilicon gate electrode by depositing polysilicon of varying grain size Arne Ballantine, Kevin K. Chan, Jeffrey D. Gilbert, Kevin M. Houlihan, James J. Quinlivan +3 more 2003-12-30
6660664 Structure and method for formation of a blocked silicide resistor James W. Adkisson, Arne Ballantine, Matthew D. Gallagher, Peter J. Geiss, Jeffrey D. Gilbert +6 more 2003-12-09
6509265 Process for manufacturing a contact barrier Patrick W. DeHaven, Anthony G. Domenicucci, Lynne M. Gignac, Prabhat Tiwari, Yun-Yu Wang +2 more 2003-01-21
6348419 Modification of the wet characteristics of deposited layers and in-line control Frank Grellner, Paul C. Jamison, David C. Mosher, Emmanuel Batt 2002-02-19
6250803 Method for temperature measurement using dopant segregation into titanium silicide Arne Ballantine 2001-06-26
6235597 Semiconductor structure having reduced silicide resistance between closely spaced gates and method of fabrication 2001-05-22
6187679 Low temperature formation of low resistivity titanium silicide Cyril Cabral, Jr., Lawrence A. Clevenger, Francois M. d'Heurle, James M. E. Harper, Randy W. Mann +3 more 2001-02-13
6180521 Process for manufacturing a contact barrier Patrick W. DeHaven, Anthony G. Domenicucci, Lynne M. Gignac, Prabhat Tiwari, Yun-Yu Wang +2 more 2001-01-30
6180456 Triple polysilicon embedded NVRAM cell and method thereof Chung H. Lam, Jame Spiros Nakos, Christa R. Willets 2001-01-30
6069040 Fabricating a floating gate with field enhancement feature self-aligned to a groove Robert K. Leidy 2000-05-30
6060358 Damascene NVRAM cell and method of manufacture John A. Bracchitta, Jeffrey B. Johnson 2000-05-09
5828131 Low temperature formation of low resistivity titanium silicide Cyril Cabral, Jr., Lawrence A. Clevenger, Francois M. d'Heurle, James M. E. Harper, Randy W. Mann +3 more 1998-10-27
5510295 Method for lowering the phase transformation temperature of a metal silicide Cyril Cabral, Jr., Lawrence A. Clevenger, Francois M. d'Heurle, James M. E. Harper, Randy W. Mann +1 more 1996-04-23
4983544 Silicide bridge contact process Nicky C. Lu, Brian J. Machesney, Rick L. Mohler, Chung-Yu Ting, Stephen D. Warley 1991-01-08