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Layered article data verification |
Mark C. H. Lamorey |
2005-09-13 |
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Method for forming a voltage programming element |
Claude L. Bertin, Erik L. Hedberg, Russell J. Houghton, Max G. Levy, William R. Tonti +1 more |
2004-11-02 |
| 6388305 |
Electrically programmable antifuses and methods for forming the same |
Claude L. Bertin, Erik L. Hedberg, Russell J. Houghton, Max G. Levy, William R. Tonti +1 more |
2002-05-14 |
| 6373091 |
Vertical DRAM cell with TFT over trench capacitor |
David V. Horak, Gorden Seth Starkey, Jr. |
2002-04-16 |
| 6328794 |
Method of controlling stress in a film |
Donald W. Brouillette, Timothy C. Krywanczyk, Jerome B. Lasky, Wolfgang Rauscher |
2001-12-11 |
| 6258689 |
Low resistance fill for deep trench capacitor |
Gary B. Bronner, Jeffrey P. Gambino, Jack A. Mandelman, Carl Radens, William R. Tonti |
2001-07-10 |
| 6228706 |
Vertical DRAM cell with TFT over trench capacitor |
David V. Horak, Gorden Seth Starkey, Jr. |
2001-05-08 |
| 6022796 |
Geometrical control of device corner threshold |
Wayne S. Berry, Juergen Faul, Wilfried E. Haensch |
2000-02-08 |
| 5998852 |
Geometrical control of device corner threshold |
Wayne S. Berry, Juergen Faul, Wilfried E. Haensch |
1999-12-07 |
| 5913125 |
Method of controlling stress in a film |
Donald W. Brouillette, Timothy C. Krywanczyk, Jerome B. Lasky, Wolfgang Rauscher |
1999-06-15 |
| 5858866 |
Geometrical control of device corner threshold |
Wayne S. Berry, Juergen Faul, Wilfried E. Haensch |
1999-01-12 |
| 4983544 |
Silicide bridge contact process |
Nicky C. Lu, Brian J. Machesney, Glen L. Miles, Chung-Yu Ting, Stephen D. Warley |
1991-01-08 |
| 4873205 |
Method for providing silicide bridge contact between silicon regions separated by a thin dielectric |
Dale L. Critchlow, John K. DeBrosse, Wendell P. Noble, Paul C. Parries |
1989-10-10 |
| 4600445 |
Process for making self aligned field isolation regions in a semiconductor substrate |
Robert Hörr |
1986-07-15 |