| 9958403 |
Arrangement for X-Ray tomography |
Pavel Stejskal, Marek Un{hacek over (c)}ovský, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Bart Buijsse, Pierre Bleuet |
2018-05-01 |
| 9162211 |
Micro-reactor for observing particles in a fluid |
Gerard Anne Nicolaas van Veen, Jacobus Peter Johannes Peters, Pleun Dona |
2015-10-20 |
| 8692196 |
Method of use for a multipole detector for a transmission electron microscope |
Peter Christiaan Tiemeijer, Uwe Luecken, Hendrik Nicolaas Slingerland |
2014-04-08 |
| 8598542 |
Charged particle beam processing |
Milos Toth, Richard Young, Alexander Henstra, Johannes Jacobus Lambertus Mulders |
2013-12-03 |
| 8597565 |
Method for forming microscopic 3D structures |
Jacob Simon Faber, Johannes Jacobus Lambertus Mulders, Carmen Francisca Maria van Vilsteren |
2013-12-03 |
| 8592762 |
Method of using a direct electron detector for a TEM |
Uwe Luecken, Gerrit Cornelis van Hoften, Frank Jeroen Pieter Schuurmans |
2013-11-26 |
| 8581189 |
Charged particle microscopy imaging method |
Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Cornelis Sander Kooijman, Berend Helmerus Lich |
2013-11-12 |
| 7915584 |
TEM with aberration corrector and phase plate |
Peter Christiaan Tiemeijer |
2011-03-29 |
| 5986270 |
Particle-optical apparatus including a low-temperature specimen holder |
Bernardus Jacobus Marie Bormans, Karel Diederick Van Der Mast, Raymond Wagner, Peter E. S. J. Asselbergs |
1999-11-16 |
| 5448063 |
Energy filter with correction of a second-order chromatic aberration |
Johan G. Bakker, Harald Rose |
1995-09-05 |
| 5233192 |
Method for autotuning of an electron microscope, and an electron microscope suitable for carrying out such a method |
Dirk E. M. Van Dijck |
1993-08-03 |
| 5221844 |
Charged particle beam device |
Karel Diederick Van Der Mast |
1993-06-22 |
