Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5233192 | Method for autotuning of an electron microscope, and an electron microscope suitable for carrying out such a method | Alan Frank de Jong | 1993-08-03 |
| 5134288 | Method of directly deriving amplitude and phase information of an object from images produced by a high-resolution electron microscope | — | 1992-07-28 |