XM

Xin Miao

IBM: 308 patents #70 of 70,183Top 1%
Globalfoundries: 8 patents #444 of 4,424Top 15%
IN Inventec: 3 patents #194 of 1,270Top 20%
Apple: 3 patents #7,422 of 18,612Top 40%
CC Crrc Qingdao Sifang Co.: 2 patents #47 of 309Top 20%
TE Tessera: 2 patents #162 of 271Top 60%
ET Elpis Technologies: 2 patents #16 of 121Top 15%
S( Sq Technology (Shanghai): 1 patents #9 of 27Top 35%
SU Shandong Jianzhu University: 1 patents #14 of 102Top 15%
KW Kwai: 1 patents #14 of 26Top 55%
IT Inet Technologies: 1 patents #9 of 25Top 40%
📍 Saratoga, CA: #4 of 2,933 inventorsTop 1%
🗺 California: #193 of 386,348 inventorsTop 1%
Overall (All Time): #1,070 of 4,157,543Top 1%
323
Patents All Time

Issued Patents All Time

Showing 101–125 of 323 patents

Patent #TitleCo-InventorsDate
10756216 Nanosheet mosfet with isolated source/drain epitaxy and close junction proximity Alexander Reznicek, Choonghyun Lee, Jingyun Zhang 2020-08-25
10749038 Width adjustment of stacked nanowires Kangguo Cheng, Ruilong Xie, Tenko Yamashita 2020-08-18
10741557 Hybrid high mobility channel transistors Chen Zhang, Kangguo Cheng, Wenyu Xu 2020-08-11
10734287 Fabrication of a pair of vertical fin field effect transistors having a merged top source/drain Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-08-04
10734477 FinFET with reduced parasitic capacitance Kangguo Cheng, Darsen D. Lu, Tenko Yamashita 2020-08-04
10734501 Metal gate structure having gate metal layer with a top portion width smaller than a bottom portion width to reduce transistor gate resistance Kangguo Cheng, Chen Zhang, Wenyu Xu 2020-08-04
10727345 Silicon germanium fin immune to epitaxy defect Kangguo Cheng, Juntao Li 2020-07-28
10680061 Sacrificial layer for channel surface retention and inner spacer formation in stacked-channel FETs Josephine B. Chang, Michael A. Guillorn, Isaac Lauer 2020-06-09
10679890 Nanosheet structure with isolated gate Alexander Reznicek, Joshua M. Rubin 2020-06-09
10669579 DNA sequencing with stacked nanopores Zhenxing Bi, Kangguo Cheng, Juntao Li 2020-06-02
10672888 Vertical transistors having improved gate length control Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-06-02
10665694 Vertical transistors having improved gate length control Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-05-26
10665666 Method of forming III-V on insulator structure on semiconductor substrate Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-05-26
10658387 Extremely thin silicon-on-insulator silicon germanium device without edge strain relaxation Kangguo Cheng, Juntao Li, Zuoguang Liu 2020-05-19
10658246 Self-aligned vertical fin field effect transistor with replacement gate structure Chen Zhang, Tenko Yamashita, Kangguo Cheng, Juntao Li 2020-05-19
10658481 Self-aligned gate cut in direct stacked vertical transport field effect transistor (VTFET) Chen Zhang, Tenko Yamashita, Kangguo Cheng 2020-05-19
10658493 Gate spacer and inner spacer formation for nanosheet transistors having relatively small space between gates Zhenxing Bi, Kangguo Cheng, Nicolas Loubet, Wenyu Xu, Chen Zhang 2020-05-19
10658461 Nanowire with sacrificial top wire Josephine B. Chang, Bruce B. Doris, Michael A. Guillorn, Isaac Lauer 2020-05-19
10644150 Tunnel field-effect transistor with reduced subthreshold swing Chen Zhang, Kangguo Cheng, Wenyu Xu 2020-05-05
10636895 Vertical transport field effect transistor on silicon with defined junctions Chen Zhang, Kangguo Cheng, Wenyu Xu 2020-04-28
10622454 Formation of a semiconductor device with RIE-free spacers Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-04-14
10622354 FinFETs with controllable and adjustable channel doping Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-04-14
10622264 Nanosheet devices with different types of work function metals Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-04-14
10615267 Semiconductor device strain relaxation buffer layer Kangguo Cheng, Wenyu Xu, Chen Zhang 2020-04-07
10615258 Nanosheet semiconductor structure with inner spacer formed by oxidation Kangguo Cheng, Chen Zhang, Wenyu Xu 2020-04-07