KS

Katherine L. Saenger

IBM: 154 patents #272 of 70,183Top 1%
KT King Abdulaziz City For Science And Technology: 7 patents #22 of 573Top 4%
Globalfoundries: 3 patents #1,029 of 4,424Top 25%
Infineon Technologies Ag: 2 patents #4,439 of 7,486Top 60%
TC Toshiba America Electronic Components: 1 patents #23 of 77Top 30%
📍 Ossining, NY: #6 of 613 inventorsTop 1%
🗺 New York: #232 of 115,490 inventorsTop 1%
Overall (All Time): #5,648 of 4,157,543Top 1%
157
Patents All Time

Issued Patents All Time

Showing 126–150 of 157 patents

Patent #TitleCo-InventorsDate
6391773 Method and materials for through-mask electroplating and selective base removal Panayotis Andricacos, Cyril Cabral, Jr., Roy A. Carruthers, Alfred Grill 2002-05-21
6388285 Feram cell with internal oxygen source and method of oxygen release Charles T. Black, Cyril Cabral, Jr., Alfred Grill, Deborah A. Neumayer, Wilbur D. Pricer +1 more 2002-05-14
6346484 Method for selective extraction of sacrificial place-holding material used in fabrication of air gap-containing interconnect structures John M. Cotte, Christopher V. Jahnes, Kenneth McCullough, Wayne M. Moreau, Satyanarayana V. Nitta +1 more 2002-02-12
6333202 Flip FERAM cell and method to form same James W. Adkisson, Charles T. Black, Alfred Grill, Randy W. Mann, Deborah A. Neumayer +2 more 2001-12-25
6323127 Capacitor formed with Pt electrodes having a 3D cup-like shape with roughened inner and outer surfaces Panayotis Andricacos, Gregory Costrini, David E. Kotecki 2001-11-27
6265779 Method and material for integration of fuorine-containing low-k dielectrics Alfred Grill, Christopher V. Jahnes, Vishnubhai V. Patel 2001-07-24
6242321 Structure and fabrication method for non-planar memory elements Raul E. Acosta, James H. Comfort, Alfred Grill, David E. Kotecki 2001-06-05
6207584 High dielectric constant material deposition to achieve high capacitance Hua Shen, David E. Kotecki, Robert Benjamin Laibowitz, Satish D. Athavale, Jenny Lian +3 more 2001-03-27
6188120 Method and materials for through-mask electroplating and selective base removal Panayotis Andricacos, Cyril Cabral, Jr., Roy A. Carruthers, Alfred Grill 2001-02-13
6187679 Low temperature formation of low resistivity titanium silicide Cyril Cabral, Jr., Lawrence A. Clevenger, Francois M. d'Heurle, James M. E. Harper, Randy W. Mann +3 more 2001-02-13
6184121 Chip interconnect wiring structure with low dielectric constant insulator and methods for fabricating the same Leena Paivikki Buchwalter, Alessandro C. Callegari, Stephan A. Cohen, Teresita O. Graham, John P. Hummel +3 more 2001-02-06
6172385 Multilayer ferroelectric capacitor structure Peter Richard Duncombe, Robert Benjamin Laibowitz, Deborah A. Neumayer, Thomas Shaw 2001-01-09
6140226 Dual damascene processing for semiconductor chip interconnects Alfred Grill, John P. Hummel, Christopher V. Jahnes, Vishnubhai V. Patel 2000-10-31
6131258 Sidewall capacitor with L-shaped dielectric James H. Comfort, Alfred Grill, David E. Kotecki 2000-10-17
6096590 Scalable MOS field effect transistor Kevin K. Chan, Jack O. Chu, Khalid EzzEldin Ismail, Stephen A. Rishton 2000-08-01
6030904 Stabilization of low-k carbon-based dielectrics Alfred Grill, Christopher V. Jahnes, Vishnubhai V. Patel 2000-02-29
6027966 Isolated sidewall capacitor James H. Comfort, Alfred Grill, David E. Kotecki 2000-02-22
6017814 Structure and fabrication method for stackable, air-gap-containing low epsilon dielectric layers Alfred Grill 2000-01-25
5998250 Compound electrode stack capacitor Panayotis Andricacos, David E. Kotecki 1999-12-07
5955759 Reduced parasitic resistance and capacitance field effect transistor Khalid EzzEldin Ismail, Stephen A. Rishton 1999-09-21
5932907 Method, materials, and structures for noble metal electrode contacts to silicon Alfred Grill, David E. Kotecki 1999-08-03
5914851 Isolated sidewall capacitor James H. Comfort, Alfred Grill, David E. Kotecki 1999-06-22
5869880 Structure and fabrication method for stackable, air-gap-containing low epsilon dielectric layers Alfred Grill 1999-02-09
5828131 Low temperature formation of low resistivity titanium silicide Cyril Cabral, Jr., Lawrence A. Clevenger, Francois M. d'Heurle, James M. E. Harper, Randy W. Mann +3 more 1998-10-27
5825609 Compound electrode stack capacitor Panayotis Andricacos, David E. Kotecki 1998-10-20