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Highly-conformal, pliable thin electromagnetic skin |
Amir I. Zaghloul, Quang M. Nguyen |
2024-09-10 |
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| 11806367 |
Methods of treating lysosomal disorders |
Stephanie Cherqui, Sylvia Evans |
2023-11-07 |
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| 11065347 |
Methods for the treatment of Danon disease and other disorders of autophagy |
Bradley Nelson, Sherin Hashem |
2021-07-20 |
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| 8736503 |
Compact Rotman lens using metamaterials |
Amir I. Zaghloul |
2014-05-27 |
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| 7326987 |
Non-continuous encapsulation layer for MIM capacitor |
Wagdi W. Abadeer, Zhong-Xiang He, Bradley A. Orner, Vidhya Ramachandran, Barbara Waterhouse +1 more |
2008-02-05 |
$10,462,000 |
| 7302376 |
Device modeling for proximity effects |
Serge Biesemans, Micah Galland, Terence B. Hook, Judith H. McCullen, Eric Phipps +1 more |
2007-11-27 |
$7,635,000 |
| 7132325 |
Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure |
Wagdi W. Abadeer, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more |
2006-11-07 |
$5,535,000 |
| 6993814 |
Method of fabricating a capacitor having sidewall spacer protecting the dielectric layer |
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2006-02-07 |
$5,045,000 |
| 6913965 |
Non-Continuous encapsulation layer for MIM capacitor |
Wagdi W. Abadeer, Zhong-Xiang He, Bradley A. Orner, Vidhya Ramachandran, Barbara Waterhouse +1 more |
2005-07-05 |
$5,545,000 |
| 6770907 |
Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure |
Wagdi W. Abadeer, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more |
2004-08-03 |
$6,296,000 |
| 6750114 |
One-mask metal-insulator-metal capacitor and method for forming same |
Anthony K. Stamper |
2004-06-15 |
$11,083,000 |
| 6683345 |
Semiconductor device and method for making the device having an electrically modulated conduction channel |
James S. Dunn, Joseph A. Iadanza, Jenifer E. Lary, Kent E. Morrett, Josef S. Watts |
2004-01-27 |
$11,745,000 |
| 6667539 |
Method to increase the tuning voltage range of MOS varactors |
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2003-12-23 |
$13,142,000 |
| 6624031 |
Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure |
Wagdi W. Abadeer, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more |
2003-09-23 |
$14,600,000 |
| 6531375 |
Method of forming a body contact using BOX modification |
Kenneth J. Giewont, Neena Garg, Michael Hargrove, Charles W. Koburger, III, Junedong Lee +2 more |
2003-03-11 |
$18,284,000 |
| 6476483 |
Method and apparatus for cooling a silicon on insulator device |
James S. Dunn, Kent E. Morrett, Edward J. Nowak, Stephen A. St. Onge |
2002-11-05 |
$17,812,000 |
| 6452779 |
One-mask metal-insulator-metal capacitor and method for forming same |
Anthony K. Stamper |
2002-09-17 |
$8,846,000 |
| 6433372 |
Dense multi-gated device design |
Kerry Bernstein, John J. Ellis-Monaghan, Jenifer E. Lary, Edward J. Nowak, Norman J. Rohrer |
2002-08-13 |
$10,700,000 |
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Capacitor having sidewall spacer protecting the dielectric layer |
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2002-02-05 |
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Metal-insulator-metal capacitor for copper damascene process and method of forming the same |
Henry W. Trombley |
2001-07-10 |
$19,901,000 |
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Field effect transistor having contact layer of transistor gate electrode material |
Subhash B. Kulkarni, Randy W. Mann, Werner Rausch, Luigi Ternullo, Jr. |
1998-05-26 |
$6,589,000 |
| 5744384 |
Semiconductor structures which incorporate thin film transistors |
Subhash B. Kulkarni, Randy W. Mann, Werner Rausch, Luigi Ternullo, Jr. |
1998-04-28 |
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| 5691549 |
Sidewall strap |
Chung H. Lam, James S. Nakos, Donald M. Kenney |
1997-11-25 |
$17,756,000 |
| 5670812 |
Field effect transistor having contact layer of transistor gate electrode material |
Subhash B. Kulkarni, Randy W. Mann, Werner Rausch, Luigi Ternullo, Jr. |
1997-09-23 |
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| 5521118 |
Sidewall strap |
Chung H. Lam, James S. Nakos, Donald M. Kenney |
1996-05-28 |
$12,387,000 |
