Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12089385 | Highly-conformal, pliable thin electromagnetic skin | Amir I. Zaghloul, Quang M. Nguyen | 2024-09-10 |
| 11806367 | Methods of treating lysosomal disorders | Stephanie Cherqui, Sylvia Evans | 2023-11-07 |
| 11065347 | Methods for the treatment of Danon disease and other disorders of autophagy | Bradley Nelson, Sherin Hashem | 2021-07-20 |
| 8736503 | Compact Rotman lens using metamaterials | Amir I. Zaghloul | 2014-05-27 |
| 7326987 | Non-continuous encapsulation layer for MIM capacitor | Wagdi W. Abadeer, Zhong-Xiang He, Bradley A. Orner, Vidhya Ramachandran, Barbara Waterhouse +1 more | 2008-02-05 |
| 7302376 | Device modeling for proximity effects | Serge Biesemans, Micah Galland, Terence B. Hook, Judith H. McCullen, Eric Phipps +1 more | 2007-11-27 |
| 7132325 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Wagdi W. Abadeer, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more | 2006-11-07 |
| 6993814 | Method of fabricating a capacitor having sidewall spacer protecting the dielectric layer | — | 2006-02-07 |
| 6913965 | Non-Continuous encapsulation layer for MIM capacitor | Wagdi W. Abadeer, Zhong-Xiang He, Bradley A. Orner, Vidhya Ramachandran, Barbara Waterhouse +1 more | 2005-07-05 |
| 6770907 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Wagdi W. Abadeer, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more | 2004-08-03 |
| 6750114 | One-mask metal-insulator-metal capacitor and method for forming same | Anthony K. Stamper | 2004-06-15 |
| 6683345 | Semiconductor device and method for making the device having an electrically modulated conduction channel | James S. Dunn, Joseph A. Iadanza, Jenifer E. Lary, Kent E. Morrett, Josef S. Watts | 2004-01-27 |
| 6667539 | Method to increase the tuning voltage range of MOS varactors | — | 2003-12-23 |
| 6624031 | Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure | Wagdi W. Abadeer, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jonathan M. McKenna, Jed H. Rankin +2 more | 2003-09-23 |
| 6531375 | Method of forming a body contact using BOX modification | Kenneth J. Giewont, Neena Garg, Michael Hargrove, Charles W. Koburger, III, Junedong Lee +2 more | 2003-03-11 |
| 6476483 | Method and apparatus for cooling a silicon on insulator device | James S. Dunn, Kent E. Morrett, Edward J. Nowak, Stephen A. St. Onge | 2002-11-05 |
| 6452779 | One-mask metal-insulator-metal capacitor and method for forming same | Anthony K. Stamper | 2002-09-17 |
| 6433372 | Dense multi-gated device design | Kerry Bernstein, John J. Ellis-Monaghan, Jenifer E. Lary, Edward J. Nowak, Norman J. Rohrer | 2002-08-13 |
| 6344964 | Capacitor having sidewall spacer protecting the dielectric layer | — | 2002-02-05 |
| 6259128 | Metal-insulator-metal capacitor for copper damascene process and method of forming the same | Henry W. Trombley | 2001-07-10 |
| 5757050 | Field effect transistor having contact layer of transistor gate electrode material | Subhash B. Kulkarni, Randy W. Mann, Werner Rausch, Luigi Ternullo, Jr. | 1998-05-26 |
| 5744384 | Semiconductor structures which incorporate thin film transistors | Subhash B. Kulkarni, Randy W. Mann, Werner Rausch, Luigi Ternullo, Jr. | 1998-04-28 |
| 5691549 | Sidewall strap | Chung H. Lam, James S. Nakos, Donald M. Kenney | 1997-11-25 |
| 5670812 | Field effect transistor having contact layer of transistor gate electrode material | Subhash B. Kulkarni, Randy W. Mann, Werner Rausch, Luigi Ternullo, Jr. | 1997-09-23 |
| 5521118 | Sidewall strap | Chung H. Lam, James S. Nakos, Donald M. Kenney | 1996-05-28 |