| 7132325 |
Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure |
Wagdi W. Abadeer, Eric Adler, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jed H. Rankin +2 more |
2006-11-07 |
| 6770907 |
Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure |
Wagdi W. Abadeer, Eric Adler, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jed H. Rankin +2 more |
2004-08-03 |
| 6731179 |
System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) |
Wagdi W. Abadeer, Wayne F. Ellis, Patrick R. Hansen |
2004-05-04 |
| 6624031 |
Test structure and methodology for semiconductor stress-induced defects and antifuse based on same test structure |
Wagdi W. Abadeer, Eric Adler, Jeffrey S. Brown, Robert J. Gauthier, Jr., Jed H. Rankin +2 more |
2003-09-23 |
| 6188234 |
Method of determining dielectric time-to-breakdown |
Wagdi W. Abadeer |
2001-02-13 |
