Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6731179 | System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) | Wagdi W. Abadeer, Wayne F. Ellis, Jonathan M. McKenna | 2004-05-04 |
| 6714113 | Inductor for integrated circuits | Wagdi W. Abadeer, Robert A. Groves | 2004-03-30 |
| 6617986 | Area efficient, sequential gray code to thermometer code decoder | John Connor, Steven Leschuk, Jason Rotella | 2003-09-09 |
| 6542418 | Redundant memory array having dual-use repair elements | George M. Braceras | 2003-04-01 |
| 6509778 | BIST circuit for variable impedance system | George M. Braceras, Steven Burns, Harold Pilo | 2003-01-21 |
| 6501293 | Method and apparatus for programmable active termination of input/output devices | George M. Braceras, John Connor | 2002-12-31 |
| 6441646 | Structure and method of alternating precharge in dynamic SOI circuits | George M. Braceras | 2002-08-27 |
| 6278339 | Termination resistance independent system for impedance matching in high speed input-output chip interfacing | Wagdi W. Abadeer, John Connor | 2001-08-21 |
| 6269461 | Testing method for dynamic logic keeper device | Robert Dean Adams, Phillip J. Nigh | 2001-07-31 |
| 6249193 | Termination impedance independent system for impedance matching in high speed input-output chip interfacing | Wagdi W. Abadeer, John Connor | 2001-06-19 |
| 6181155 | Method and apparatus for testing dynamic logic using an improved reset pulse | R. Dean Adams | 2001-01-30 |
| 6163862 | On-chip test circuit for evaluating an on-chip signal using an external test signal | R. Dean Adams, Edmond S. Cooley | 2000-12-19 |
| 6140885 | On-chip automatic system for impedance matching in very high speed input-output chip interfacing | Wagdi W. Abadeer, John Connor | 2000-10-31 |
| 6133749 | Variable impedance output driver circuit using analog biases to match driver output impedance to load input impedance | Harold Pilo | 2000-10-17 |