| 6353903 |
Method and apparatus for testing differential signals |
John Connor, Donald Albert Evans, Luigi Ternullo, Jr. |
2002-03-05 |
| 6269461 |
Testing method for dynamic logic keeper device |
Patrick R. Hansen, Phillip J. Nigh |
2001-07-31 |
| 6252417 |
Fault identification by voltage potential signature |
Frederick G. Adams, Edmond S. Cooley |
2001-06-26 |
| 5802070 |
Testing associative memory |
Kevin A. Batson, George M. Braceras, Fred J. Towler |
1998-09-01 |
| 5796745 |
Memory array built-in self test circuit for testing multi-port memory arrays |
John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. |
1998-08-18 |
| 5793592 |
Dynamic dielectric protection circuit for a receiver |
George M. Braceras, John Connor, Donald Albert Evans |
1998-08-11 |
| 5790564 |
Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor |
John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. |
1998-08-04 |
| 5784323 |
Test converage of embedded memories on semiconductor substrates |
John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. |
1998-07-21 |
| 5771242 |
Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor |
John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. |
1998-06-23 |
| 5761213 |
Method and apparatus to determine erroneous value in memory cells using data compression |
John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. |
1998-06-02 |
| 5745498 |
Rapid compare of two binary numbers |
John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. |
1998-04-28 |
| 5740098 |
Using one memory to supply addresses to an associated memory during testing |
John Connor, James J. Covino, Roy C. Flaker, Garrett Stephen Koch, Alan L. Roberts +2 more |
1998-04-14 |
| 5563833 |
Using one memory to supply addresses to an associated memory during testing |
John Connor, James J. Covino, Roy C. Flaker, Garrett Stephen Koch, Alan L. Roberts +2 more |
1996-10-08 |
| 5535164 |
BIST tester for multiple memories |
John Connor, Garrett Stephen Koch, Stuart Rapoport, Luigi Ternullo, Jr. |
1996-07-09 |
| 5313424 |
Module level electronic redundancy |
Henry A. Bonges, III, James Dawson, Erik L. Hedberg |
1994-05-17 |
| 4782250 |
CMOS off-chip driver circuits |
Roy C. Flaker, Kenneth S. Gray, Howard L. Kalter |
1988-11-01 |
