Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6353903 | Method and apparatus for testing differential signals | John Connor, Donald Albert Evans, Luigi Ternullo, Jr. | 2002-03-05 |
| 6269461 | Testing method for dynamic logic keeper device | Patrick R. Hansen, Phillip J. Nigh | 2001-07-31 |
| 6252417 | Fault identification by voltage potential signature | Frederick G. Adams, Edmond S. Cooley | 2001-06-26 |
| 5802070 | Testing associative memory | Kevin A. Batson, George M. Braceras, Fred J. Towler | 1998-09-01 |
| 5796745 | Memory array built-in self test circuit for testing multi-port memory arrays | John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. | 1998-08-18 |
| 5793592 | Dynamic dielectric protection circuit for a receiver | George M. Braceras, John Connor, Donald Albert Evans | 1998-08-11 |
| 5790564 | Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor | John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. | 1998-08-04 |
| 5784323 | Test converage of embedded memories on semiconductor substrates | John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. | 1998-07-21 |
| 5771242 | Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor | John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. | 1998-06-23 |
| 5761213 | Method and apparatus to determine erroneous value in memory cells using data compression | John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. | 1998-06-02 |
| 5745498 | Rapid compare of two binary numbers | John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. | 1998-04-28 |
| 5740098 | Using one memory to supply addresses to an associated memory during testing | John Connor, James J. Covino, Roy C. Flaker, Garrett Stephen Koch, Alan L. Roberts +2 more | 1998-04-14 |
| 5563833 | Using one memory to supply addresses to an associated memory during testing | John Connor, James J. Covino, Roy C. Flaker, Garrett Stephen Koch, Alan L. Roberts +2 more | 1996-10-08 |
| 5535164 | BIST tester for multiple memories | John Connor, Garrett Stephen Koch, Stuart Rapoport, Luigi Ternullo, Jr. | 1996-07-09 |
| 5313424 | Module level electronic redundancy | Henry A. Bonges, III, James Dawson, Erik L. Hedberg | 1994-05-17 |
| 4782250 | CMOS off-chip driver circuits | Roy C. Flaker, Kenneth S. Gray, Howard L. Kalter | 1988-11-01 |