Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 6081910 | Circuit for allowing a two-pass fuse blow to memory chips combining an array built-in self-test with redundancy capabilities | Jean-Paul Mifsud | 2000-06-27 | $38,700,000 |
| 5557619 | Integrated circuits with a processor-based array built-in self test circuit | — | 1996-09-17 | $12,073,000 |
| 5535164 | BIST tester for multiple memories | Robert Dean Adams, John Connor, Garrett Stephen Koch, Luigi Ternullo, Jr. | 1996-07-09 | $6,020,000 |
| 5442641 | Fast data compression circuit for semiconductor memory chips including an array built-in self-test structure | Herve Beranger, Frederic Joly | 1995-08-15 | $7,944,000 |
| 5386392 | Programmable high speed array clock generator circuit for array built-in self test memory chips | Thierry Cantiant, Bertrand Gabillard, Jean-Paul Mifsud | 1995-01-31 | $9,170,000 |