Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6081910 | Circuit for allowing a two-pass fuse blow to memory chips combining an array built-in self-test with redundancy capabilities | Stuart Rapoport | 2000-06-27 |
| 5386392 | Programmable high speed array clock generator circuit for array built-in self test memory chips | Thierry Cantiant, Bertrand Gabillard, Stuart Rapoport | 1995-01-31 |