Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
JC

John Connor — 23 Patents

IBM: 21 patents #5,175 of 70,183Top 8%
WEWestinghouse Electric: 2 patents #1,558 of 5,139Top 35%
Walker, MI: #1 of 58 inventorsTop 2%
Michigan: #3,266 of 86,293 inventorsTop 4%
Overall (All Time): #186,552 of 4,157,543Top 5%
23 Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
6965503 Electro-static discharge protection circuit Robert J. Gauthier, Jr., Christopher S. Putnam, Alan L. Roberts 2005-11-15
6617986 Area efficient, sequential gray code to thermometer code decoder Patrick R. Hansen, Steven Leschuk, Jason Rotella 2003-09-09
6501293 Method and apparatus for programmable active termination of input/output devices George M. Braceras, Patrick R. Hansen 2002-12-31
6353903 Method and apparatus for testing differential signals Robert Dean Adams, Donald Albert Evans, Luigi Ternullo, Jr. 2002-03-05
6278339 Termination resistance independent system for impedance matching in high speed input-output chip interfacing Wagdi W. Abadeer, Patrick R. Hansen 2001-08-21
6249193 Termination impedance independent system for impedance matching in high speed input-output chip interfacing Wagdi W. Abadeer, Patrick R. Hansen 2001-06-19
6140885 On-chip automatic system for impedance matching in very high speed input-output chip interfacing Wagdi W. Abadeer, Patrick R. Hansen 2000-10-31
5929667 Method and apparatus for protecting circuits subjected to high voltage Wagdi W. Abadeer, George M. Braceras, Donald Albert Evans 1999-07-27
5815354 Receiver input voltage protection circuit George M. Braceras, Donald Albert Evans 1998-09-29
5796745 Memory array built-in self test circuit for testing multi-port memory arrays Robert Dean Adams, Garrett Stephen Koch, Luigi Ternullo, Jr. 1998-08-18
5793592 Dynamic dielectric protection circuit for a receiver Robert Dean Adams, George M. Braceras, Donald Albert Evans 1998-08-11
5790564 Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor Robert Dean Adams, Garrett Stephen Koch, Luigi Ternullo, Jr. 1998-08-04
5784323 Test converage of embedded memories on semiconductor substrates Robert Dean Adams, Garrett Stephen Koch, Luigi Ternullo, Jr. 1998-07-21
5771242 Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor Robert Dean Adams, Garrett Stephen Koch, Luigi Ternullo, Jr. 1998-06-23
5761213 Method and apparatus to determine erroneous value in memory cells using data compression Robert Dean Adams, Garrett Stephen Koch, Luigi Ternullo, Jr. 1998-06-02
5745498 Rapid compare of two binary numbers Robert Dean Adams, Garrett Stephen Koch, Luigi Ternullo, Jr. 1998-04-28
5740098 Using one memory to supply addresses to an associated memory during testing Robert Dean Adams, James J. Covino, Roy C. Flaker, Garrett Stephen Koch, Alan L. Roberts +2 more 1998-04-14
5563833 Using one memory to supply addresses to an associated memory during testing Robert Dean Adams, James J. Covino, Roy C. Flaker, Garrett Stephen Koch, Alan L. Roberts +2 more 1996-10-08
5553082 Built-in self-test for logic circuitry at memory array output Luigi Ternullo, Jr. 1996-09-03
5539753 Method and apparatus for output deselecting of data during test Stuart J. Hall, Marcel J. Robillard, Luigi Ternullo, Jr. 1996-07-23
5535164 BIST tester for multiple memories Robert Dean Adams, Garrett Stephen Koch, Stuart Rapoport, Luigi Ternullo, Jr. 1996-07-09
5088541 Space dividing panel system with counter cap Brian J. Persing 1992-02-18
5057039 Electrical or communications monument for mounting along an edge of a work surface Brian J. Persing, Philip C. Banas, Timothy J. Wiersma, James R. Bouse 1991-10-15