Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8093657 | Circuit and methods to improve the operation of SOI devices | Louis C. Hsu, Jente B. Kuang | 2012-01-10 |
| 7405982 | Methods to improve the operation of SOI devices | Jente B. Kuang, Louis L. Hsu | 2008-07-29 |
| 6410369 | Soi-body selective link method and apparatus | Louis L. Hsu, Fariborz Assaderaghi, Jack A. Mandelman | 2002-06-25 |
| 6160292 | Circuit and methods to improve the operation of SOI devices | Louis L. Hsu, Jente B. Kuang | 2000-12-12 |
| 6133608 | SOI-body selective link method and apparatus | Louis L. Hsu, Fariborz Assaderaghi, Jack A. Mandelman | 2000-10-17 |
| 5740098 | Using one memory to supply addresses to an associated memory during testing | Robert Dean Adams, John Connor, James J. Covino, Garrett Stephen Koch, Alan L. Roberts +2 more | 1998-04-14 |
| 5721863 | Method and structure for accessing semi-associative cache memory using multiple memories to store different components of the address | James J. Covino, Alan L. Roberts, Jose R. Sousa | 1998-02-24 |
| 5715188 | Method and apparatus for parallel addressing of CAMs and RAMs | James J. Covino, Alan L. Roberts, Jose R. Sousa | 1998-02-03 |
| 5604518 | Memory structure with multiple integrated memory array portions | Gregory J. Schroer, Roderick M. P. West, Todd Williams | 1997-02-18 |
| 5592142 | High speed greater than or equal to compare circuit | R. Dean Adams, Donald Albert Evans | 1997-01-07 |
| 5563833 | Using one memory to supply addresses to an associated memory during testing | Robert Dean Adams, John Connor, James J. Covino, Garrett Stephen Koch, Alan L. Roberts +2 more | 1996-10-08 |
| 5101120 | BiCMOS output driver | Henry A. Bonges, III | 1992-03-31 |
| 4782250 | CMOS off-chip driver circuits | Robert Dean Adams, Kenneth S. Gray, Howard L. Kalter | 1988-11-01 |
| 4730122 | Power supply adapter systems | Jeffrey H. Dreibelbis, Erik L. Hedberg | 1988-03-08 |
| 4719418 | Defect leakage screen system | Russell J. Houghton | 1988-01-12 |
| 4404635 | Programmable integrated circuit and method of testing the circuit before it is programmed | — | 1983-09-13 |