Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Using one memory to supply addresses to an associated memory during testing

Using one memory to supply addresses to an associated memory during testing

US Patent 5740098 · Granted Apr 14, 1998

Estimated economic value: $13,289,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Ostomy apparatuses and methods of use2025
Fluid treatment assemblies2017
Large diameter thermoplastic seal2017
Method of forming large diameter thermoplastic seal2014
Circuit and methods to improve the operation of SOI devices2012
Multiple uses for BIST test latches2011
Scannable dynamic circuit latch2010
Multiple uses for BIST test latches2009
Methods and apparatus for testing a memory2009
Methods to improve the operation of SOI devices2008
Memory device with data line steering and bitline redundancy2006
Dynamically adjustable on-chip supply voltage generation2006