MY

Mark Yam

Applied Materials: 46 patents #183 of 7,310Top 3%
NS Novellus Systems: 2 patents #345 of 780Top 45%
📍 Monte Sereno, CA: #18 of 229 inventorsTop 8%
🗺 California: #8,490 of 386,348 inventorsTop 3%
Overall (All Time): #58,014 of 4,157,543Top 2%
48
Patents All Time

Issued Patents All Time

Showing 26–48 of 48 patents

Patent #TitleCo-InventorsDate
7109087 Absorber layer for DSA processing Luc Van Autryve, Chris Bencher, Dean Jennings, Haifan Liang, Abhilash J. Mayur +2 more 2006-09-19
7078302 Gate electrode dopant activation method for semiconductor manufacturing including a laser anneal Yi Ma, Khaled Ahmed, Kevin Cunningham, Robert C. McIntosh, Abhilash J. Mayur +6 more 2006-07-18
7041931 Stepped reflector plate Dean Jennings, Joseph M. Ranish, Brian Haas, Ajit Balakrishna, Sundar Ramamurthy +1 more 2006-05-09
6987240 Thermal flux processing by scanning Dean Jennings, Abhilash J. Mayur, Vernon Behrens, Paul A. O'Brien, Leonid M. Tertitski +1 more 2006-01-17
6721605 Multi-computer chamber control system, method and medium Alexey Goder 2004-04-13
6500266 Heater temperature uniformity qualification tool Henry Ho, Alexander M. Rubinchik, Aihua Chen, Abril Cabreros, Steven T. Li +1 more 2002-12-31
6424880 Multi-computer chamber control system, method and medium Alexey Goder 2002-07-23
6406179 Sensor for measuring a substrate temperature Bruce E. Adams, Aaron Muir Hunter, Alex Rubinchik, Paul A. O'Brien 2002-06-18
6345909 Apparatus for infrared pyrometer calibration in a thermal processing system 2002-02-12
6226453 Temperature probe with fiber optic core Bruce W. Peuse 2001-05-01
6183130 Apparatus for substrate temperature measurement using a reflecting cavity and detector Bruce E. Adams, Aaron Muir Hunter, Alex Rubinchik, Paul A. O'Brien 2001-02-06
6179466 Method and apparatus for measuring substrate temperatures Bruce W. Peuse, Gary E. Miner, Aaron Muir Hunter, Peter A. Knoot, Jason Mershon 2001-01-30
6179465 Method and apparatus for infrared pyrometer calibration in a thermal processing system using multiple light sources 2001-01-30
6151446 Apparatus and method for thermally processing substrates including a processor using multiple detection signals Aaron Muir Hunter, Abhilash J. Mayur 2000-11-21
6086245 Apparatus for infrared pyrometer calibration in a thermal processing system 2000-07-11
6056433 Method and apparatus for infrared pyrometer calibration in a thermal processing system 2000-05-02
6007241 Apparatus and method for measuring substrate temperature Aaron Muir Hunter 1999-12-28
5938335 Self-calibrating temperature probe 1999-08-17
5848842 Method of calibrating a temperature measurement system Bruce W. Peuse, Gary E. Miner 1998-12-15
5820261 Method and apparatus for infrared pyrometer calibration in a rapid thermal processing system 1998-10-13
5762419 Method and apparatus for infrared pyrometer calibration in a thermal processing system 1998-06-09
5755511 Method and apparatus for measuring substrate temperatures Bruce W. Peuse, Gary E. Miner 1998-05-26
5660472 Method and apparatus for measuring substrate temperatures Bruce W. Peuse, Gary E. Miner 1997-08-26