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Carbon layer covered mask in 3D applications |
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Damage free metal conductor formation |
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Residual removal |
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| 10692734 |
Methods of patterning nickel silicide layers on a semiconductor device |
Chentsau Chris Ying, He Ren, Srinivas D. Nemani, Ellie Yieh |
2020-06-23 |
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Damage free metal conductor formation |
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2020-06-16 |
| 10643854 |
Silicon dioxide-polysilicon multi-layered stack etching with plasma etch chamber employing non-corrosive etchants |
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Recursive pumping for symmetrical gas exhaust to control critical dimension uniformity in plasma reactors |
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Etching oxide-nitride stacks using C4F6H2 |
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| 9589832 |
Maintaining mask integrity to form openings in wafers |
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Plasma etch processes for opening mask layers |
Jairaj Payyapilly |
2016-04-05 |
| 9299574 |
Silicon dioxide-polysilicon multi-layered stack etching with plasma etch chamber employing non-corrosive etchants |
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| 9269587 |
Methods for etching materials using synchronized RF pulses |
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2016-02-23 |
| 9129911 |
Boron-doped carbon-based hardmask etch processing |
Kenny L. Doan, Daisuke Shimizu |
2015-09-08 |
| 8778207 |
Plasma etch processes for boron-doped carbonaceous mask layers |
Jairaj Payyapilly, Kenny L. Doan |
2014-07-15 |
| 8668837 |
Method for etching substrate |
Kenny L. Doan |
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| 8603921 |
Maintaining mask integrity to form openings in wafers |
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Halogen-free amorphous carbon mask etch having high selectivity to photoresist |
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