William J. Campbell — 40 Patents at AMD

William J. Campbell has been granted 40 US patents while listed as an inventor at AMD. The first was granted in 1981 and the most recent in September 2025. William J. Campbell ranks #78,057 of 4,157,543 US inventors in our database (top 1.9%). Patent records list William J. Campbell in Svanaträsket, SC, US.

Issued Patents All Time

Showing 1–25 of 40 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
D1093252	Window visor extension	—	2025-09-16
8322282	Apparatus and process for transporting lithographic plates to a press cylinder	Dennis M. Burgess	2012-12-04
7621219	Method and apparatus for registration of an imaged lithographic plate	Dennis M. Burgess, Joseph A. Stein	2009-11-24
7610855	Apparatus and process for transporting lithographic plates to a press cylinder	Dennis M. Burgess	2009-11-03
6856849	Method for adjusting rapid thermal processing (RTP) recipe setpoints based on wafer electrical test (WET) parameters	Terrence J. Riley	2005-02-15	$5,967,000
6850322	Method and apparatus for controlling wafer thickness uniformity in a multi-zone vertical furnace	Scott Bushman, Thomas J. Sonderman, Elfido Coss, Jr.	2005-02-01	$6,992,000
6819963	Run-to-run control method for proportional-integral-derivative (PID) controller tuning for rapid thermal processing (RTP)	Terrence J. Riley	2004-11-16	$6,082,000
6650957	Method and apparatus for run-to-run control of deposition process	Thomas J. Sonderman, Craig W. Christian	2003-11-18	$4,875,000
6607926	Method and apparatus for performing run-to-run control in a batch manufacturing environment	Anthony J. Toprac, Christopher A. Bode	2003-08-19	$7,296,000
6592429	Method and apparatus for controlling wafer uniformity in a chemical mechanical polishing tool using carrier head signatures	—	2003-07-15	$1,952,000
6567718	Method and apparatus for monitoring consumable performance	Jeremy Lansford, Michael R. Conboy	2003-05-20	$2,116,000
6560503	Method and apparatus for monitoring controller performance using statistical process control	Anthony J. Toprac	2003-05-06	$2,132,000
6556884	Method and apparatus for interfacing a statistical process control system with a manufacturing process control framework	Michael L. Miller, Anatasia L. Oshelski	2003-04-29	$1,822,000
6546306	Method for adjusting incoming film thickness uniformity such that variations across the film after polishing minimized	Scott Bushman	2003-04-08	$2,382,000
6529789	Method and apparatus for automatic routing for reentrant processes	Anthony J. Toprac, Christopher A. Bone	2003-03-04	$1,276,000
6484064	Method and apparatus for running metrology standard wafer routes for cross-fab metrology calibration	—	2002-11-19	$1,532,000
6475280	Coating machine for applying and drying photosensitive emulsion on a plastic film	Dennis M. Burgess	2002-11-05
6454899	Apparatus for filling trenches	H. Jim Fulford, Christopher H. Raeder, Craig W. Christian, Thomas J. Sonderman	2002-09-24	$1,057,000
6376261	Method for varying nitride strip makeup process based on field oxide loss and defect count	—	2002-04-23	$2,653,000
6360133	Method and apparatus for automatic routing for reentrant process	Anthony J. Toprac, Christopher A. Bone	2002-03-19	$4,163,000
6352867	Method of controlling feature dimensions based upon etch chemistry concentrations	Terri A. Couteau, Anthony J. Toprac	2002-03-05	$11,927,000
6350179	Method for determining a polishing recipe based upon the measured pre-polish thickness of a process layer	Jeremy Lansford	2002-02-26	$4,948,000
6324341	Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization	Terrence J. Riley, Qingsu Wang, Michael L. Miller, Jeff Thompson	2001-11-27	$5,286,000
6284622	Method for filling trenches	H. Jim Fulford, Christopher H. Raeder, Craig W. Christian, Thomas J. Sonderman	2001-09-04	$3,567,000
6265304	Controlling an etching process of multiple layers based upon thickness ratio of the dielectric layers	—	2001-07-24	$3,903,000

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William J. Campbell — 40 Patents

Issued Patents All Time

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