MC

Michael R. Conboy

AM AMD: 59 patents #99 of 9,279Top 2%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
HI Himont: 1 patents #48 of 121Top 40%
WA Western Geophysical Company Of America: 1 patents #10 of 40Top 25%
Micron: 1 patents #4,761 of 6,345Top 80%
Overall (All Time): #34,974 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 25 most recent of 64 patents

Patent #TitleCo-InventorsDate
8180587 System for brokering fault detection data Elfido Cross, Jr., Sam Allen 2012-05-15
7200779 Fault notification based on a severity level Elfido Coss, Jr., Susan Hickey 2007-04-03
7162326 Mask identification database server Russel Shirley, Horace Paul Bowser, Jr. 2007-01-09
7130769 Method of dynamically designing a preventative maintenance schedule based upon sensor data, and system for accomplishing same Sam Allen, Elfido Coss, Jr. 2006-10-31
7092779 Automated material handling system for a manufacturing facility divided into separate fabrication areas Danny C. Shedd, Elfido Coss, Jr. 2006-08-15
7051250 Routing workpieces based upon detecting a fault Sam Allen, Michael L. Miller, Elfido Coss, Jr. 2006-05-23
7039495 Management of multiple types of empty carriers in automated material handling systems Patrick J. Ryan, Elfido Coss, Jr. 2006-05-02
6985794 Management of move requests from a factory system to an automated material handling system Russel Shirley, Jason Grover 2006-01-10
6954883 Method and apparatus for performing fault detection using data from a database Elfido Coss, Jr., Susan Hickey 2005-10-11
6928333 Scheduling method for automated work-cell transfer system Patrick J. Ryan, Elfido Coss, Jr. 2005-08-09
6895295 Method and apparatus for controlling a multi-chamber processing tool Jason Grover, Sam Allen 2005-05-17
6878895 Reticle sorter Patrick J. Ryan, Stephen P. Hovestol 2005-04-12
6871112 Method for requesting trace data reports from FDC semiconductor fabrication processes Elfido Coss, Jr., Bryce A. Hendrix 2005-03-22
6792389 Method of dynamically enabling additional sensors based upon initial sensor data, and system for accomplishing same Sam Allen, Elfido Coss, Jr. 2004-09-14
6790680 Determining a possible cause of a fault in a semiconductor fabrication process Jason Grover, Elfido Coss, Jr., Sam Allen 2004-09-14
6766285 Predictive processing method in a semiconductor processing facility Sam Allen, Jason Grover 2004-07-20
6763277 Method and apparatus for proactive dispatch system to improve line balancing Sam Allen, Jason Grover 2004-07-13
6763278 Operating a processing tool in a degraded mode upon detecting a fault Elfido Coss, Jr., Sam Allen 2004-07-13
6711450 Integration of business rule parameters in priority setting of wafer processing Elfido Coss, Jr., Jason Grover 2004-03-23
6699004 Wafer rotation in wafer handling devices Russel Shirley, Elfido Coss, Jr. 2004-03-02
6666337 Method and apparatus for determining wafer identity and orientation Sam Allen, Elfido Coss, Jr. 2003-12-23
6662070 Wafer rotation randomization in cluster tool processing Sam Allen, Russel Shirley, Elfido Coss, Jr. 2003-12-09
6662076 Management of move requests from a factory system to an automated material handling system Russel Shirley, Jason Grover 2003-12-09
6638778 Method for determining, tracking and/or controlling processing based upon silicon characteristics Anastasia Oshelski Peterson, Sam Allen, Jason Grover 2003-10-28
6629012 Wafer-less qualification of a processing tool Terrence J. Riley, Qingsu Wang, Michael L. Miller, W. Jarrett Campbell 2003-09-30