AP

Anastasia Oshelski Peterson

AM AMD: 15 patents #735 of 9,279Top 8%
🗺 Texas: #9,719 of 125,132 inventorsTop 8%
Overall (All Time): #325,416 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
8321048 Associating data with workpieces and correlating the data with yield data Elfido Coss, Jr., Christopher A. Bode 2012-11-27
7103439 Method and apparatus for initializing tool controllers based on tool event data Christopher A. Bode, Alexander J. Pasadyn, Anthony J. Toprac, Joyce S. Oey Hewett, Thomas J. Sonderman +1 more 2006-09-05
7098048 Method and apparatus for capturing fault state data 2006-08-29
6970757 Method and apparatus for updating control state variables of a process control model based on rework data Joyce S. Oey Hewett, Anthony J. Toprac, Christopher A. Bode, Alexander J. Pasadyn, Thomas J. Sonderman +1 more 2005-11-29
6937914 Method and apparatus for controlling process target values based on manufacturing metrics Christopher A. Bode, Thomas J. Sonderman, Alexander J. Pasadyn, Anthony J. Toprac, Joyce S. Oey Hewett +1 more 2005-08-30
6922595 Selecting control algorithms based on business rules Michael L. Miller 2005-07-26
6901340 Method and apparatus for distinguishing between sources of process variation Alexander J. Pasadyn, Joyce S. Oey Hewett, Christopher A. Bode, Anthony J. Toprac, Thomas J. Sonderman +1 more 2005-05-31
6801817 Method and apparatus for integrating multiple process controllers Christopher A. Bode, Alexander J. Pasadyn, Anthony J. Toprac, Joyce S. Oey Hewett, Thomas J. Sonderman +1 more 2004-10-05
6802045 Method and apparatus for incorporating control simulation environment Thomas J. Sonderman, Anthony J. Toprac 2004-10-05
6785586 Method and apparatus for adaptively scheduling tool maintenance Anthony J. Toprac, Thomas J. Sonderman, Christopher A. Bode, Alexander J. Pasadyn, Joyce S. Oey Hewett +1 more 2004-08-31
6699727 Method for prioritizing production lots based on grade estimates and output requirements Anthony J. Toprac, Joyce S. Oey Hewett, Christopher A. Bode, Alexander J. Pasadyn, Thomas J. Sonderman +1 more 2004-03-02
6675058 Method and apparatus for controlling the flow of wafers through a process flow Alexander J. Pasadyn, Anthony J. Toprac, Christopher A. Bode, Joyce S. Oey Hewett, Thomas J. Sonderman +1 more 2004-01-06
6638778 Method for determining, tracking and/or controlling processing based upon silicon characteristics Sam Allen, Jason Grover, Michael R. Conboy 2003-10-28
6615098 Method and apparatus for controlling a tool using a baseline control script Christopher A. Bode, Alexander J. Pasadyn, Anthony J. Toprac, Joyce S. Oey Hewett, Thomas J. Sonderman +1 more 2003-09-02
6564171 Method and apparatus for parsing event logs to determine tool operability Richard John Edwards 2003-05-13