Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
QW

Qingsu Wang — 14 Patents

AMD: 14 patents #883 of 9,280Top 10%
Austin, TX: #2,366 of 18,064 inventorsTop 15%
Texas: #10,699 of 125,132 inventorsTop 9%
Overall (All Time): #332,869 of 4,157,543Top 9%
14 Patents All Time
Qingsu Wang has been granted 14 US patents while listed as an inventor at AMD. The first was granted in 1998 and the most recent in November 2005. Qingsu Wang ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Qingsu Wang in Austin, TX, US.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
6968303 Automated system for extracting and combining tool trace data and wafer electrical test (WET) data for semiconductor processing Elfido Coss, Jr. 2005-11-22 $6,256,000
6738731 Method and apparatus for using tool state information to identify faulty wafers Terrence J. Riley, Glen W. Scheid, Kent Knox 2004-05-18 $4,574,000
6725402 Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework Elfido Coss, Jr., Terrence J. Riley 2004-04-20 $2,632,000
6697691 Method and apparatus for fault model analysis in manufacturing tools Michael L. Miller, Terrence J. Riley 2004-02-24 $4,069,000
6629012 Wafer-less qualification of a processing tool Terrence J. Riley, Michael R. Conboy, Michael L. Miller, W. Jarrett Campbell 2003-09-30 $4,535,000
6556959 Method and apparatus for updating a manufacturing model based upon fault data relating to processing of semiconductor wafers Michael L. Miller 2003-04-29 $1,822,000
6556882 Method and apparatus for generating real-time data from static files Michael R. Conboy, Elfido Coss, Jr. 2003-04-29 $1,822,000
6546508 Method and apparatus for fault detection of a processing tool in an advanced process control (APC) framework Thomas J. Sonderman, Elfido Coss, Jr. 2003-04-08 $2,382,000
6532555 Method and apparatus for integration of real-time tool data and in-line metrology for fault detection in an advanced process control (APC) framework Michael L. Miller, Elfido Coss, Jr. 2003-03-11 $2,325,000
6324341 Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization Terrence J. Riley, Michael L. Miller, William J. Campbell, Jeff Thompson 2001-11-27 $5,286,000
6268270 Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization Glen W. Scheid, Terrence J. Riley, Michael L. Miller, Si QIN 2001-07-31 $5,560,000
5914879 System and method for calculating cluster tool performance metrics using a weighted configuration matrix Craig W. Christian, John B. Crowley, Denver L. Dolman 1999-06-22 $4,853,000
5859964 System and method for performing real time data acquisition, process modeling and fault detection of wafer fabrication processes Gerald W. Barnett, R. Michael Greig, Yi Cheng 1999-01-12 $4,051,000
5740429 E10 reporting tool John G. Zvonar, Mike Simpson 1998-04-14 $4,151,000