RR

Rodney L. Robison

TL Tokyo Electron Limited: 18 patents #330 of 5,567Top 6%
LL Lateral Research Limited Liability: 1 patents #41 of 92Top 45%
📍 East Berne, NY: #1 of 16 inventorsTop 7%
🗺 New York: #7,406 of 115,490 inventorsTop 7%
Overall (All Time): #230,548 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
12341053 System for backside deposition of a substrate Ronald Nasman, Gerrit J. Leusink, Hoyoung Kang, Daniel Fulford 2025-06-24
11908728 System for backside deposition of a substrate Ronald Nasman, Gerrit J. Leusink, Hoyoung Kang, Daniel Fulford 2024-02-20
11383211 Point-of-use dynamic concentration delivery system with high flow and high uniformity Ronald Nasman, Lior Huli, Anton J. deVilliers, Norman A. Jacobson, Jr., James Grootegoed 2022-07-12
10426001 Processing system for electromagnetic wave treatment of a substrate at microwave frequencies Ronald Nasman, Mirko Vukovic, Gerrit J. Leusink, Robert D. Clark 2019-09-24
10403501 High-purity dispense system Anton J. deVilliers, Ronald Nasman, David Travis, James Grootegoed, Norman A. Jacobson, Jr. +2 more 2019-09-03
10354872 High-precision dispense system with meniscus control Anton J. deVilliers, Ronald Nasman, David Travis, James Grootegoed, Norman A. Jacobson, Jr. +3 more 2019-07-16
8194384 High temperature electrostatic chuck and method of using Ronald Nasman, Toshiaki Fujisato 2012-06-05
8028655 Plasma processing system with locally-efficient inductive plasma coupling Jozef Brcka 2011-10-04
7901545 Ionized physical vapor deposition (iPVD) process Frank M. Cerio, Jr., Jacques Faguet, Bruce Gittleman 2011-03-08
7810449 Plasma processing system with locally-efficient inductive plasma coupling Jozef Brcka 2010-10-12
7776748 Selective-redeposition structures for calibrating a plasma process Jozef Brcka, Takashi Horiuchi 2010-08-17
7772110 Electrical contacts for integrated circuits and methods of forming using gas cluster ion beam processing Douglas M. Trickett 2010-08-10
7749398 Selective-redeposition sources for calibrating a plasma process Jozef Brcka, Takashi Horiuchi 2010-07-06
7744735 Ionized PVD with sequential deposition and etching Jacques Faguet, Bruce Gittleman, Tugrul Yasar, Frank M. Cerio, Jr., Jozef Brcka 2010-06-29
7591935 Enhanced reliability deposition baffle for iPVD Jozef Brcka 2009-09-22
7273533 Plasma processing system with locally-efficient inductive plasma coupling Jozef Brcka 2007-09-25
6755945 Ionized PVD with sequential deposition and etching Tugrul Yasar, Glyn Reynolds, Frank M. Cerio, Jr., Bruce Gittleman, Michael Grapperhaus 2004-06-29
6183615 Transport system for wafer processing line Tugrul Yasar, Daniel Deyo, Marian Zielinski 2001-02-06
5408322 Self aligning in-situ ellipsometer and method of using for process monitoring Jon Hsu, Bhola De, Tugrul Yasar 1995-04-18