YC

Ya Hui Chang

TSMC: 51 patents #639 of 12,232Top 6%
PE Pegavision: 2 patents #13 of 29Top 45%
NT National Taiwan University Of Science And Technology: 1 patents #163 of 607Top 30%
NM Novatek Microelectronics: 1 patents #575 of 986Top 60%
TU Tzu Chi University: 1 patents #4 of 22Top 20%
UM United Microelectronics: 1 patents #2,686 of 4,560Top 60%
Overall (All Time): #42,522 of 4,157,543Top 2%
57
Patents All Time

Issued Patents All Time

Showing 26–50 of 57 patents

Patent #TitleCo-InventorsDate
10861698 Pattern fidelity enhancement Yu-Tien Shen, Ya-Wen Yeh, Wei-Liang Lin, Yung-Sung Yen, Wei-Hao Wu +3 more 2020-12-08
10761427 Photoresist and method of formation and use Keng-Chu Lin, Joung-Wei Liou, Cheng-Han Wu 2020-09-01
10707081 Fine line patterning methods Shih-Chun Huang, Chiu-Hsiang Chen, Ya-Wen Yeh, Yu-Tien Shen, Po-Chin Chang +7 more 2020-07-07
10658184 Pattern fidelity enhancement with directional patterning technology Yu-Tien Shen, Chi-Cheng Hung, Chin-Hsiang Lin, Chien-Wei Wang, Ching-Yu Chang +7 more 2020-05-19
10354874 Directional processing to remove a layer or a material formed over a substrate Shih-Chun Huang, Chin-Hsiang Lin, Chien-Wen Lai, Ru-Gun Liu, Wei-Liang Lin +3 more 2019-07-16
9983473 Photomask and method for fabricating integrated circuit Chun Lin, Yi-Jie Chen, Feng-Yuan Chiu, Ying-Chou Cheng, Kuei-Liang Lu +2 more 2018-05-29
9925293 Solution for treating contact lens Han-Yi Chang, Ya-Hsuan Liao, Shu Lu, Yu-Chin Lai 2018-03-27
9823574 Lithography alignment marks Ching-Huang Chen, Hung-Chang Hsieh, Kuei-Liang Lu, Spencer B. T. Lin 2017-11-21
9805154 Method of lithography process with inserting scattering bars Irene Ho, Ai-Jen Hung, Hung-Chang Hsieh, Kuei-Liang Lu 2017-10-31
9786569 Overlay measurement and compensation in semiconductor fabrication Wei-De Ho, Shu-Hong Lin, Chih-Jung Chiang, Chang-Yi Tsai, Tsung-Lin Yang +1 more 2017-10-10
9766545 Methods for small trench patterning using chemical amplified photoresist compositions Chia-Chu Liu 2017-09-19
9703918 Two-dimensional process window improvement Wei-De Ho, Chi-Yuan Sun, Hung-Chang Hsieh 2017-07-11
9612526 Photomask and method for fabricating integrated circuit Chun Lin, Yi-Jie Chen, Feng-Yuan Chiu, Ying-Chou Cheng, Kuei-Liang Lu +2 more 2017-04-04
9524939 Multiple edge enabled patterning Ming-Feng Shieh, Ru-Gun Liu, Tsong-Hua Ou, Ken-Hsien Hsieh, Burn Jeng Lin 2016-12-20
9478459 Device and methods for small trench patterning 2016-10-25
9341945 Photoresist and method of formation and use Keng-Chu Lin, Joung-Wei Liou, Cheng-Han Wu 2016-05-17
9287125 Multiple edge enabled patterning Ming-Feng Shieh, Ru-Gun Liu, Tsong-Hua Ou, Ken-Hsien Hsieh, Burn Jeng Lin 2016-03-15
9196491 End-cut first approach for critical dimension control Li-Te Lin, Meng-Jun Wang, Hui Ouyang 2015-11-24
9111864 Device and methods for small trench patterning 2015-08-18
9093276 Methods for small trench patterning using chemical amplified photoresist compositions Chia-Chu Liu 2015-07-28
8877598 Method of lithography process with an under isolation material layer Chung-Ming Wang, Yu-Lun Liu, Chia-Chu Liu, Kuei-Shun Chen 2014-11-04
8865595 Device and methods for forming partially self-aligned trenches 2014-10-21
8767302 Laminated optical disk Jong-Woei Whang, Chieh-Jen Hsiao, Meng-Che Tsai, Chung-Wei Wang 2014-07-01
8765608 Methods for forming trenches 2014-07-01
8730473 Multiple edge enabled patterning Ming-Feng Shieh, Ru-Gun Liu, Tsong-Hua Ou, Ken-Hsien Hsieh, Burn Jeng Lin 2014-05-20