Issued Patents All Time
Showing 1–25 of 111 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12416864 | Tool mismatch reduction using aberration map of the tools | Shih-Chuan Huang, Sheng-Min WANG, Shih-Ming Chang | 2025-09-16 |
| 12386251 | Method and system to introduce bright field imaging at stitching area of high-NA EUV exposure | Sheng-Min WANG, Manuel Lopez, Yu-Tse LAI | 2025-08-12 |
| 12360460 | System and method for selecting photolithography processes | Shih-Ming Chang, Yu-Tien Shen | 2025-07-15 |
| 12300609 | Two-dimensional (2D) metal structure and method of forming the same | Shih-Wei Peng, Jiann-Tyng Tzeng | 2025-05-13 |
| 12266539 | Method of manufacturing semiconductor devices | Ru-Gun Liu, Chih-Ming Lai, Wei-Liang Lin, Yung-Sung Yen, Chin-Hsiang Lin | 2025-04-01 |
| 12265334 | Optical proximity correction and photomasks | Dong-Yo Jheng, Shih-Ming Chang, Chih-Jie Lee, Shuo-Yen Chou, Ru-Gun Liu | 2025-04-01 |
| 12243741 | Semiconductor structure and method for forming the same | Johnny Chiahao Li, Shih-Ming Chang, Chi-Yu Lu, Yung-Chen Chien, Hui-Zhong Zhuang +2 more | 2025-03-04 |
| 12189284 | Method for forming semiconductor device | Sheng-Min WANG | 2025-01-07 |
| 12085867 | Lithography process monitoring method | Chih-Jie Lee, Shih-Chun Huang, Shih-Ming Chang, Yung-Sung Yen, Ru-Gun Liu | 2024-09-10 |
| 12045117 | Detecting and mitigating cross-layer impact of change events on a cloud computing system | Xiaohan YAN, Murali Mohan Chintalapati, Yingnong Dang | 2024-07-23 |
| 11923300 | Two-dimensional (2D) metal structure | Shih-Wei Peng, Jiann-Tyng Tzeng | 2024-03-05 |
| 11854820 | Spacer etching process for integrated circuit design | Ru-Gun Liu, Cheng-Hsiung Tsai, Chung-Ju Lee, Chih-Ming Lai, Chia-Ying Lee +6 more | 2023-12-26 |
| 11789370 | Optical proximity correction and photomasks | Dong-Yo Jheng, Shih-Ming Chang, Chih-Jie Lee, Shuo-Yen Chou, Ru-Gun Liu | 2023-10-17 |
| 11782352 | Lithography process monitoring method | Chih-Jie Lee, Shih-Chun Huang, Shih-Ming Chang, Yung-Sung Yen, Ru-Gun Liu | 2023-10-10 |
| 11764068 | Method of manufacturing semiconductor devices | Ru-Gun Liu, Chih-Ming Lai, Wei-Liang Lin, Yung-Sung Yen, Chin-Hsiang Lin | 2023-09-19 |
| 11592751 | Method of manufacturing photo masks | Ru-Gun Liu, Wei-Shuo Su | 2023-02-28 |
| 11543753 | Tunable illuminator for lithography systems | Shih-Ming Chang, Wen Lo, Wei-Shuo Su, Hua-Tai Lin | 2023-01-03 |
| 11467509 | Lithography process monitoring method | Chih-Jie Lee, Shih-Chun Huang, Shih-Ming Chang, Yung-Sung Yen, Ru-Gun Liu | 2022-10-11 |
| 11342193 | Method of manufacturing semiconductor devices | Ru-Gun Liu, Chih-Ming Lai, Wei-Liang Lin, Yung-Sung Yen, Chin-Hsiang Lin | 2022-05-24 |
| 11294286 | Pattern formation method using a photo mask for manufacturing a semiconductor device | Ru-Gun Liu, Chin-Hsiang Lin, Cheng-I Huang, Chih-Ming Lai, Chien-Wen Lai +2 more | 2022-04-05 |
| 11243472 | Optical proximity correction and photomasks | Dong-Yo Jheng, Shih-Ming Chang, Chih-Jie Lee, Shuo-Yen Chou, Ru-Gun Liu | 2022-02-08 |
| 11165668 | Quality assessment and decision recommendation for continuous deployment of cloud infrastructure components | Pankaj Kumar Singh, Sree Krishna Chaitanya Vadrevu, Ze Li, Murali Mohan Chintalapati, Yingnong Dang | 2021-11-02 |
| 11079685 | Method of manufacturing photo masks | Ru-Gun Liu, Wei-Shuo Su | 2021-08-03 |
| 10962892 | Lithography process monitoring method | Chih-Jie Lee, Shih-Chun Huang, Shih-Ming Chang, Yung-Sung Yen, Ru-Gun Liu | 2021-03-30 |
| 10957551 | Fin-like field effect transistor patterning methods for increasing process margins | Chin-Yuan Tseng, Wei-Liang Lin, Hsin-Chih Chen, Shi Ning Ju, Yung-Sung Yen +1 more | 2021-03-23 |