BL

Burn Jeng Lin

TSMC: 132 patents #155 of 12,232Top 2%
IBM: 18 patents #6,125 of 70,183Top 9%
NU National Tsing Hua University: 6 patents #72 of 2,036Top 4%
📍 Hsinchu, NY: #4 of 65 inventorsTop 7%
Overall (All Time): #5,928 of 4,157,543Top 1%
153
Patents All Time

Issued Patents All Time

Showing 26–50 of 153 patents

Patent #TitleCo-InventorsDate
9436787 Method of fabricating an integrated circuit with optimized pattern density uniformity Jyuh-Fuh Lin, Pei-Yi Liu, Cheng-Hung Chen, Wen-Chuan Wang, Shy-Jay Lin 2016-09-06
9436788 Method of fabricating an integrated circuit with block dummy for optimized pattern density uniformity Jyuh-Fuh Lin, Pei-Yi Liu, Cheng-Hung Chen, Wen-Chuan Wang, Shy-Jay Lin 2016-09-06
9390891 Apparatus for charged particle lithography system Shih-Chi Wang, Tsung-Chih Chien, Hui-Min Huang, Jaw-Jung Shin, Shy-Jay Lin 2016-07-12
9330933 Method and apparatus for planarizing a polymer layer 2016-05-03
9329488 Grid refinement method Wen-Chuan Wang, Shy-Jay Lin, Pei-Yi Liu, Jaw-Jung Shin 2016-05-03
9291913 Pattern generator for a lithography system Chen-Hua Yu, Tien-I Bao, Chih Wei Lu, Jaw-Jung Shin, Shy-Jay Lin 2016-03-22
9287125 Multiple edge enabled patterning Ming-Feng Shieh, Ya Hui Chang, Ru-Gun Liu, Tsong-Hua Ou, Ken-Hsien Hsieh 2016-03-15
9229332 Systems and methods for high-throughput and small-footprint scanning exposure for lithography Shy-Jay Lin, Jaw-Jung Shin, Wen-Chuan Wang 2016-01-05
9182660 Methods for electron beam patterning Wen-Chuan Wang, Shy-Jay Lin, Jaw-Jung Shin 2015-11-10
9176389 Grid refinement method Wen-Chuan Wang, Shy-Jay Lin, Pei-Yi Liu, Jaw-Jung Shin 2015-11-03
9147377 Method for image dithering for lithographic processes Cheng-Hung Chen, Shy-Jay Shin, Jaw-Jung Shin 2015-09-29
9134627 Multiple-patterning overlay decoupling method Wen-Chuan Wang, Shy-Jay Lin, Pei-Yi Liu, Jaw-Jung Shin 2015-09-15
9046789 Immersion lithography system using a sealed wafer bath Ching-Yu Chang 2015-06-02
9003336 Mask assignment optimization Wen-Chun Huang, Ken-Hsien Hsieh, Ming-Hui Chih, Chih-Ming Lai, Ru-Gun Liu +4 more 2015-04-07
9001308 Pattern generator for a lithography system Chen-Hua Yu, Tien-I Bao, Chih Wei Lu, Jaw-Jung Shin, Shy-Jay Lin 2015-04-07
8987689 Efficient scan for E-beam lithography Cheng-Hung Chen, Shih-Chi Wang, Jeng-Horng Chen 2015-03-24
8984452 Long-range lithographic dose correction Cheng-Hung Chen, Shy-Jay Lin, Jaw-Jung Shin, Wen-Chuan Wang, Pei-Yi Liu 2015-03-17
8972908 Method for electron beam proximity correction with improved critical dimension accuracy Cheng-Hung Chen, Jaw-Jung Shin, Shy-Jay Lin, Wen-Chuan Wang, Pei-Yi Liu 2015-03-03
8956806 Photoresist and patterning process Chien-Wei Wang, Ching-Yu Chang 2015-02-17
8927947 Systems and methods providing electron beam writing to a medium Wen-Chuan Wang, Shy-Jay Lin, Jaw-Jung Shin 2015-01-06
8906583 Stacked mask Hsin-Chang Lee, Sheng-Chi Chin 2014-12-09
8852849 Electron beam lithography system and method for improving throughput Jaw-Jung Shin, Shy-Jay Lin, Wen-Chuan Wang 2014-10-07
8846278 Electron beam lithography system and method for improving throughput Jaw-Jung Shin, Shy-Jay Lin, Wen-Chuan Wang 2014-09-30
8848163 Photoresist materials and photolithography processes Hsien-Cheng Wang, Chin-Hsiang Lin, Heng-Jen Lee, Ching-Yu Chang, Hua-Tai Lin 2014-09-30
8828632 Multiple-grid exposure method Wen-Chuan Wang, Shy-Jay Lin, Pei-Yi Liu, Jaw-Jung Shin 2014-09-09