MO

Munehiro Ogasawara

NT Nuflare Technology: 49 patents #2 of 298Top 1%
KT Kabushiki Kaisha Toshiba: 23 patents #1,224 of 21,451Top 6%
NA Nuflare Technology America: 4 patents #3 of 10Top 30%
NT Ntt Advanced Technology: 1 patents #43 of 188Top 25%
Overall (All Time): #27,728 of 4,157,543Top 1%
72
Patents All Time

Issued Patents All Time

Showing 51–72 of 72 patents

Patent #TitleCo-InventorsDate
7692158 Charged beam drawing apparatus 2010-04-06
7508526 Defect inspecting apparatus Riki Ogawa, Toru Tojo 2009-03-24
7388216 Pattern writing and forming method 2008-06-17
7326943 Electron beam irradiating apparatus and irradiating method 2008-02-05
7270921 Pattern writing and forming method 2007-09-18
7122809 Charged beam writing method and writing tool 2006-10-17
7002167 Charged-particle beam writer 2006-02-21
6836319 Optical system adjusting method for energy beam apparatus Jun Takamatsu, Hitoshi Sunaoshi, Naoharu Shimomura 2004-12-28
6781680 Optical system adjusting method for energy beam apparatus Jun Takamatsu, Hitoshi Sunaoshi, Naoharu Shimomura 2004-08-24
6642675 Charged particle beam exposing apparatus 2003-11-04
6617592 Charged particle beam system and chamber of charged particle beam system Jun Takamatsu, Kiyoshi Hattori, Hitoshi Sunaoshi, Naoharu Shimomura, Kiminobu Akeno 2003-09-09
6606149 Optical system adjusting method for energy beam apparatus Jun Takamatsu, Hitoshi Sunaoshi, Naoharu Shimomaura 2003-08-12
6207117 Charged particle beam apparatus and gas supply and exhaustion method employed in the apparatus Jun Takamatsu 2001-03-27
6172364 Charged particle beam irradiation apparatus Jun Takamatsu, Naoharu Shimomura, Shusuke Yoshitake, Takayuki Abe, Masamitsu Itoh 2001-01-09
6028317 Charged particle beam optical element charged particle beam exposure apparatus and method of adjusting the same Ken Murooka, Hitoshi Sunaoshi 2000-02-22
5949076 Charged beam applying apparatus Kenji Ohtoshi, Jun Takamatsu, Toru Koike, Kazuyoshi Sugihara 1999-09-07
5923034 Pattern transfer mask, mask inspection method and a mask inspection apparatus Ken Murooka 1999-07-13
5850083 Charged particle beam lithograph apparatus Souji Koikari, Shuichi Tamamushi, Shusuke Yoshitake 1998-12-15
5807650 Photo mask and apparatus for repairing photo mask Haruki Komano, Hiroko Nakamura, Satoshi Masuda, Katsuya Okumura, Yoji Ogawa 1998-09-15
5793041 Method for correcting astigmatism and focusing in charged particle optical lens-barrel Shuichi Tamamushi, Kazunori Onoguchi, Hideo Wakamori 1998-08-11
5539211 Charged beam apparatus having cleaning function and method of cleaning charged beam apparatus Kenji Ohtoshi, Itsuko Sakai, Yuichiro Yamazaki, Jun Takamatsu, Kazuyoshi Sugihara 1996-07-23
4794340 Synchrotron-type accelerator with rod-shaped damping antenna 1988-12-27