KA

Kiminobu Akeno

NT Nuflare Technology: 7 patents #60 of 298Top 25%
KT Kabushiki Kaisha Toshiba: 6 patents #4,898 of 21,451Top 25%
TO Topcon: 1 patents #425 of 684Top 65%
Overall (All Time): #409,224 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
11266999 Dust-collecting apparatus Yosuke Takahashi, Yuji Abe 2022-03-08
11049688 Charged particle beam irradiation apparatus Michihiro Kawaguchi, Keita Ideno, Kota Iwasaki, Keisuke Goto, Kiyoshi Nakaso +4 more 2021-06-29
10607810 Vibration control system and optical equipment equipped therewith Michihiro Kawaguchi, Kiyoshi Nakaso, Keita Ideno, Shintaro Yamamoto, Keisuke Goto +4 more 2020-03-31
10373793 Conductive contact point pin and charged particle beam apparatus Michihiro Kawaguchi, Kenichi Kataoka, Tomoki UMETSU 2019-08-06
8987683 Charged particle beam drawing apparatus and charged particle beam drawing method Michihiro Kawaguchi, Yoshinori Kagawa, Yu Asami, Keisuke Yamaguchi 2015-03-24
8847178 Charged particle beam writing apparatus and charged particle beam writing method Michihiro Kawaguchi, Kazuhiro Shiba, Keisuke Yamaguchi, Yoshinori Kagawa 2014-09-30
8779397 Substrate cover and charged particle beam writing method using same Michihiro Kawaguchi, Keisuke Yamaguchi, Shun Kanezawa, Soichiro Mitsui 2014-07-15
7528393 Charged particle beam processing apparatus 2009-05-05
7075621 Alignment method Soichiro Mitsui, Toru Tojo 2006-07-11
6901314 Alignment apparatus for substrates Soichiro Mitsui, Toru Tojo 2005-05-31
6617592 Charged particle beam system and chamber of charged particle beam system Jun Takamatsu, Kiyoshi Hattori, Hitoshi Sunaoshi, Naoharu Shimomura, Munehiro Ogasawara 2003-09-09
5602645 Pattern evaluation apparatus and a method of pattern evaluation Mitsuo Tabata, Toru Tojo, Toshiyuki Watanabe, Tomohide Watanabe, Eiji Yamanaka +2 more 1997-02-11