Issued Patents All Time
Showing 25 most recent of 45 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11681843 | Input data compression for machine learning-based chain diagnosis | Gaurav Veda, Kun-Han Tsai, Wu-Tung Cheng, Mason Chern, Shi-Yu Huang | 2023-06-20 |
| 11408938 | Bidirectional scan cells for single-path reversible scan chains | Wu-Tung Cheng | 2022-08-09 |
| 11361248 | Multi-stage machine learning-based chain diagnosis | Gaurav Veda, Kun-Han Tsai, Wu-Tung Cheng, Mason Chern, Shi-Yu Huang | 2022-06-14 |
| 11232246 | Layout-friendly test pattern decompressor | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Jeffrey Carl Mayer | 2022-01-25 |
| 11156661 | Reversible multi-bit scan cell-based scan chains for improving chain diagnostic resolution | Wu-Tung Cheng, Szczepan Urban, Jakub Janicki, Manish Sharma | 2021-10-26 |
| 11150299 | Flexible isometric decompressor architecture for test compression | Janusz Rajski, Sylwester Milewski, Jerzy Tyszer | 2021-10-19 |
| 11106848 | Diagnostic resolution enhancement with reversible scan chains | Wu-Tung Cheng, Szczepan Urban, Jakub Janicki, Manish Sharma | 2021-08-31 |
| 11092645 | Chain testing and diagnosis using two-dimensional scan architecture | Wu-Tung Cheng | 2021-08-17 |
| 11073556 | Low pin count reversible scan architecture | Wu-Tung Cheng | 2021-07-27 |
| 11041906 | Optimized scan chain diagnostic pattern generation for reversible scan architecture | Szczepan Urban, Wu-Tung Cheng, Manish Sharma | 2021-06-22 |
| 11010523 | Prediction of test pattern counts for scan configuration determination | Janusz Rajski, Mark Kassab, Wu-Tung Cheng | 2021-05-18 |
| 10996273 | Test generation using testability-based guidance | Sylwester Milewski, Janusz Rajski | 2021-05-04 |
| 10830815 | Signal probability-based test cube reordering and merging | Janusz Rajski | 2020-11-10 |
| 10796043 | Non-adaptive pattern reordering to improve scan chain diagnostic resolution in circuit design and manufacture | Jakub Janicki, Szczepan Urban | 2020-10-06 |
| 9977080 | Generating test sets for diagnosing scan chain failures | Ruifeng Guo, Wu-Tung Cheng | 2018-05-22 |
| 9915702 | Channel sharing for testing circuits having non-identical cores | Mark Kassab, Janusz Rajski, Wu-Tung Cheng, Jay Babak Jahangiri | 2018-03-13 |
| 9857421 | Dynamic design partitioning for diagnosis | Huaxing Tang, Wu-Tung Cheng, Robert Brady Benware, Xiaoxin Fan | 2018-01-02 |
| 9689918 | Test access architecture for stacked memory and logic dies | Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Etienne Racine, Martin Keim +3 more | 2017-06-27 |
| 9501589 | Identification of power sensitive scan cells | Xijiang Lin, Wu-Tung Cheng | 2016-11-22 |
| 9335376 | Test architecture for characterizing interconnects in stacked designs | Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Jing Ye, Yu Hu | 2016-05-10 |
| 9336107 | Dynamic design partitioning for diagnosis | Huaxing Tang, Wu-Tung Cheng, Robert Brady Benware, Xiaoxin Fan | 2016-05-10 |
| 9244125 | Dynamic design partitioning for scan chain diagnosis | Huaxing Tang, Wu-Tung Cheng, Robert Brady Benware, Manish Sharma, Xiaoxin Fan | 2016-01-26 |
| 9222978 | Two-dimensional scan architecture | Wu-Tung Cheng, Ruifeng Guo, Manish Sharma, Liyang Lai | 2015-12-29 |
| 9194503 | Draining device for machine tool | — | 2015-11-24 |
| 9135103 | Hybrid memory failure bitmap classification | Wu-Tung Cheng, Christopher W. Schuermyer | 2015-09-15 |