Issued Patents All Time
Showing 25 most recent of 59 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11320487 | Programmable test compactor for improving defect determination | Wu-Tung Cheng, Chen Wang | 2022-05-03 |
| 11232246 | Layout-friendly test pattern decompressor | Yu Huang, Janusz Rajski, Nilanjan Mukherjee, Jeffrey Carl Mayer | 2022-01-25 |
| 11010523 | Prediction of test pattern counts for scan configuration determination | Yu Huang, Janusz Rajski, Wu-Tung Cheng | 2021-05-18 |
| 10977400 | Deterministic test pattern generation for designs with timing exceptions | Wu-Tung Cheng, Kun-Han Tsai, Naixing Wang, Chen Wang, Xijiang Lin +1 more | 2021-04-13 |
| 10955460 | Test scheduling and test access in test compression environment | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer | 2021-03-23 |
| 10788530 | Efficient and flexible network for streaming data in circuits | Jean-Francois Cote, Janusz Rajski | 2020-09-29 |
| 10775436 | Streaming networks efficiency using data throttling | Jean-Francois Cote, Janusz Rajski | 2020-09-15 |
| 10509073 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski | 2019-12-17 |
| 10473721 | Data streaming for testing identical circuit blocks | Jean-Francois Cote, Janusz Rajski | 2019-11-12 |
| 10476740 | Data generation for streaming networks in circuits | Jean-Francois Cote, Janusz Rajski | 2019-11-12 |
| 10234506 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2019-03-19 |
| 10120024 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng | 2018-11-06 |
| 9915702 | Channel sharing for testing circuits having non-identical cores | Yu Huang, Janusz Rajski, Wu-Tung Cheng, Jay Babak Jahangiri | 2018-03-13 |
| 9778316 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng | 2017-10-03 |
| 9720040 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski | 2017-08-01 |
| 9664739 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rasjki, Jerzy Tyszer, Nilanjan Mukherjee | 2017-05-30 |
| 9651622 | Isometric test compression with low toggling activity | Janusz Rajski, Amit Amar Kumar, Elham K. Moghaddam, Nilanjan Mukherjee, Jerzy Tyszer +1 more | 2017-05-16 |
| 9335374 | Dynamic shift for test pattern compression | Xijiang Lin, Janusz Rajski | 2016-05-10 |
| 9134370 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee | 2015-09-15 |
| 9086454 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski | 2015-07-21 |
| 9088522 | Test scheduling with pattern-independent test access mechanism | Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Jakub Janicki, Jerzy Tyszer +1 more | 2015-07-21 |
| 9026874 | Test access mechanism for diagnosis based on partitioning scan chains | Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Robert Brady Benware | 2015-05-05 |
| 8726112 | Scan test application through high-speed serial input/outputs | Janusz Rajski, Nilanjan Mukherjee, Thomas Hans Rinderknecht, Mohamed Dessouky | 2014-05-13 |
| 8607107 | Test access mechanism for diagnosis based on partitioining scan chains | Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Robert Brady Benware | 2013-12-10 |
| 8560906 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski | 2013-10-15 |