| 11320487 |
Programmable test compactor for improving defect determination |
Wu-Tung Cheng, Chen Wang |
2022-05-03 |
|
| 11232246 |
Layout-friendly test pattern decompressor |
Yu Huang, Janusz Rajski, Nilanjan Mukherjee, Jeffrey Carl Mayer |
2022-01-25 |
|
| 11010523 |
Prediction of test pattern counts for scan configuration determination |
Yu Huang, Janusz Rajski, Wu-Tung Cheng |
2021-05-18 |
|
| 10977400 |
Deterministic test pattern generation for designs with timing exceptions |
Wu-Tung Cheng, Kun-Han Tsai, Naixing Wang, Chen Wang, Xijiang Lin +1 more |
2021-04-13 |
|
| 10955460 |
Test scheduling and test access in test compression environment |
Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki, Jerzy Tyszer |
2021-03-23 |
|
| 10788530 |
Efficient and flexible network for streaming data in circuits |
Jean-Francois Cote, Janusz Rajski |
2020-09-29 |
|
| 10775436 |
Streaming networks efficiency using data throttling |
Jean-Francois Cote, Janusz Rajski |
2020-09-15 |
|
| 10509073 |
Timing-aware test generation and fault simulation |
Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski |
2019-12-17 |
|
| 10473721 |
Data streaming for testing identical circuit blocks |
Jean-Francois Cote, Janusz Rajski |
2019-11-12 |
|
| 10476740 |
Data generation for streaming networks in circuits |
Jean-Francois Cote, Janusz Rajski |
2019-11-12 |
|
| 10234506 |
Continuous application and decompression of test patterns and selective compaction of test responses |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2019-03-19 |
|
| 10120024 |
Multi-stage test response compactors |
Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng |
2018-11-06 |
|
| 9915702 |
Channel sharing for testing circuits having non-identical cores |
Yu Huang, Janusz Rajski, Wu-Tung Cheng, Jay Babak Jahangiri |
2018-03-13 |
|
| 9778316 |
Multi-stage test response compactors |
Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng |
2017-10-03 |
|
| 9720040 |
Timing-aware test generation and fault simulation |
Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski |
2017-08-01 |
|
| 9664739 |
Continuous application and decompression of test patterns and selective compaction of test responses |
Janusz Rasjki, Jerzy Tyszer, Nilanjan Mukherjee |
2017-05-30 |
|
| 9651622 |
Isometric test compression with low toggling activity |
Janusz Rajski, Amit Amar Kumar, Elham K. Moghaddam, Nilanjan Mukherjee, Jerzy Tyszer +1 more |
2017-05-16 |
|
| 9335374 |
Dynamic shift for test pattern compression |
Xijiang Lin, Janusz Rajski |
2016-05-10 |
$5,221,000 |
| 9134370 |
Continuous application and decompression of test patterns and selective compaction of test responses |
Janusz Rajski, Jerzy Tyszer, Nilanjan Mukherjee |
2015-09-15 |
$2,051,000 |
| 9086454 |
Timing-aware test generation and fault simulation |
Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski |
2015-07-21 |
$3,247,000 |
| 9088522 |
Test scheduling with pattern-independent test access mechanism |
Janusz Rajski, Grzegorz Mrugalski, Nilanjan Mukherjee, Jakub Janicki, Jerzy Tyszer +1 more |
2015-07-21 |
$3,247,000 |
| 9026874 |
Test access mechanism for diagnosis based on partitioning scan chains |
Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Robert Brady Benware |
2015-05-05 |
$6,453,000 |
| 8726112 |
Scan test application through high-speed serial input/outputs |
Janusz Rajski, Nilanjan Mukherjee, Thomas Hans Rinderknecht, Mohamed Dessouky |
2014-05-13 |
$3,032,000 |
| 8607107 |
Test access mechanism for diagnosis based on partitioining scan chains |
Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Robert Brady Benware |
2013-12-10 |
$5,152,000 |
| 8560906 |
Timing-aware test generation and fault simulation |
Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski |
2013-10-15 |
$5,423,000 |
