Issued Patents All Time
Showing 25 most recent of 83 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815555 | Universal compactor architecture for testing circuits | Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Grzegorz Mrugalski, Bartosz Wlodarczak | 2023-11-14 |
| 11585853 | Trajectory-optimized test pattern generation for built-in self-test | Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Lukasz Rybak | 2023-02-21 |
| 11555854 | Deterministic stellar built-in self test | Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski | 2023-01-17 |
| 11150299 | Flexible isometric decompressor architecture for test compression | Janusz Rajski, Yu Huang, Sylwester Milewski | 2021-10-19 |
| 10955460 | Test scheduling and test access in test compression environment | Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jakub Janicki | 2021-03-23 |
| 10509072 | Test application time reduction using capture-per-cycle test points | Janusz Rajski, Sylwester Milewski, Nilanjan Mukherjee, Jedrzej Solecki, Justyna Zawada | 2019-12-17 |
| 10444282 | Test point insertion for low test pattern counts | Janusz Rajski, Elham K. Moghaddam, Nilanjan Mukherjee, Justyna Zawada | 2019-10-15 |
| 10379161 | Scan chain stitching for test-per-clock | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2019-08-13 |
| 10361873 | Test point-enhanced hardware security | Janusz Rajski, Nilanjan Mukherjee, Elham K. Moghaddam, Justyna Zawada | 2019-07-23 |
| 10234506 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2019-03-19 |
| 10120024 | Multi-stage test response compactors | Janusz Rajski, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng | 2018-11-06 |
| 10120029 | Low power testing based on dynamic grouping of scan | Janusz Rajski, Sylwester Milewski, Grzegorz Mrugalski | 2018-11-06 |
| 9933485 | Deterministic built-in self-test based on compressed test patterns stored on chip and their derivatives | Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki | 2018-04-03 |
| 9778316 | Multi-stage test response compactors | Janusz Rajski, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng | 2017-10-03 |
| 9720041 | Scan-based test architecture for interconnects in stacked designs | Janusz Rajski | 2017-08-01 |
| 9714981 | Test-per-clock based on dynamically-partitioned reconfigurable scan chains | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2017-07-25 |
| 9664739 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rasjki, Mark Kassab, Nilanjan Mukherjee | 2017-05-30 |
| 9651622 | Isometric test compression with low toggling activity | Janusz Rajski, Amit Amar Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee +1 more | 2017-05-16 |
| 9377508 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee | 2016-06-28 |
| 9347993 | Test generation for test-per-clock | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2016-05-24 |
| 9335377 | Test-per-clock based on dynamically-partitioned reconfigurable scan chains | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2016-05-10 |
| 9250287 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Janusz Rajski | 2016-02-02 |
| 9134370 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2015-09-15 |
| 9088522 | Test scheduling with pattern-independent test access mechanism | Janusz Rajski, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Jakub Janicki +1 more | 2015-07-21 |
| 9009553 | Scan chain configuration for test-per-clock based on circuit topology | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2015-04-14 |