Issued Patents All Time
Showing 51–75 of 83 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7805651 | Phase shifter with reduced linear dependency | Janusz Rajski, Nagesh Tamarapalli | 2010-09-28 |
| 7797603 | Low power decompression of test cubes | Janusz Rajski, Grzegorz Mrugalski, Dariusz Czysz | 2010-09-14 |
| 7743302 | Compressing test responses using a compactor | Janusz Rajski, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2010-06-22 |
| 7653851 | Phase shifter with reduced linear dependency | Janusz Rajski, Nagesh Tamarapalli | 2010-01-26 |
| 7647540 | Decompressors for low power decompression of test patterns | Janusz Rajski, Grzegorz Mrugalski, Dariusz Czysz | 2010-01-12 |
| 7523372 | Phase shifter with reduced linear dependency | Janusz Rajski, Nagesh Tamarapalli | 2009-04-21 |
| 7509550 | Fault diagnosis of compressed test responses | Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Chen Wang | 2009-03-24 |
| 7509546 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2009-03-24 |
| 7506232 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2009-03-17 |
| 7500163 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2009-03-03 |
| 7493540 | Continuous application and decompression of test patterns to a circuit-under-test | Jansuz Rajski, Mark Kassab, Nilanjan Mukherjee | 2009-02-17 |
| 7478296 | Continuous application and decompression of test patterns to a circuit-under-test | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2009-01-13 |
| 7437640 | Fault diagnosis of compressed test responses having one or more unknown states | Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Chen Wang | 2008-10-14 |
| 7370254 | Compressing test responses using a compactor | Janusz Rajski, Chen Wang, Grzegorz Mrugalski, Artur Pogiel | 2008-05-06 |
| 7302624 | Adaptive fault diagnosis of compressed test responses | Janusz Rajski, Grzegorz Mrugalski, Artur Pogiel, Chen Wang | 2007-11-27 |
| 7263641 | Phase shifter with reduced linear dependency | Janusz Rajski, Nagesh Tamarapalli | 2007-08-28 |
| 7260591 | Method for synthesizing linear finite state machines | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2007-08-21 |
| 7111209 | Test pattern compression for an integrated circuit test environment | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2006-09-19 |
| 7093175 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2006-08-15 |
| 6954888 | Arithmetic built-in self-test of multiple scan-based integrated circuits | Janusz Rajski | 2005-10-11 |
| 6874109 | Phase shifter with reduced linear dependency | Janusz Rajski, Nagesh Tamarapalli | 2005-03-29 |
| 6829740 | Method and apparatus for selectively compacting test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2004-12-07 |
| 6728901 | Arithmetic built-in self-test of multiple scan-based integrated circuits | Janusz Rajski | 2004-04-27 |
| 6708192 | Method for synthesizing linear finite state machines | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2004-03-16 |
| 6684358 | Decompressor/PRPG for applying pseudo-random and deterministic test patterns | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2004-01-27 |