Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8595574 | Enhanced diagnosis with limited failure cycles | Yu Huang, Wu-Tung Cheng, Janusz Rajski, Randy Klingenberg | 2013-11-26 |
| 8438438 | Enhanced diagnosis with limited failure cycles | Yu Huang, Wu-Tung Cheng, Randy Klingenberg, Janusz Rajski | 2013-05-07 |
| 8301414 | Compactor independent fault diagnosis | Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Janusz Rajski | 2012-10-30 |
| 7987442 | Fault dictionaries for integrated circuit yield and quality analysis methods and systems | Janusz Rajski, Gang Chen, Martin Keim, Manish Sharma, Huaxing Tang | 2011-07-26 |
| 7840862 | Enhanced diagnosis with limited failure cycles | Yu Huang, Wu-Tung Cheng, Randy Klingenberg, Janusz Rajski | 2010-11-23 |
| 7805651 | Phase shifter with reduced linear dependency | Janusz Rajski, Jerzy Tyszer | 2010-09-28 |
| 7653851 | Phase shifter with reduced linear dependency | Janusz Rajski, Jerzy Tyszer | 2010-01-26 |
| 7523372 | Phase shifter with reduced linear dependency | Janusz Rajski, Jerzy Tyszer | 2009-04-21 |
| 7512508 | Determining and analyzing integrated circuit yield and quality | Janusz Rajski, Gang Chen, Martin Keim, Manish Sharma, Huaxing Tang | 2009-03-31 |
| 7437636 | Method and apparatus for at-speed testing of digital circuits | Janusz Rajski, Abu Hassan, Robert L. Thompson | 2008-10-14 |
| 7263641 | Phase shifter with reduced linear dependency | Janusz Rajski, Jerzy Tyszer | 2007-08-28 |
| 7239978 | Compactor independent fault diagnosis | Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Janusz Rajski | 2007-07-03 |
| 6966021 | Method and apparatus for at-speed testing of digital circuits | Janusz Rajski, Abu Hassan, Robert L. Thompson | 2005-11-15 |
| 6920597 | Uniform testing of tristate nets in logic BIST | Thomas Hans Rinderknecht, Randy Klingenberg | 2005-07-19 |
| 6874109 | Phase shifter with reduced linear dependency | Janusz Rajski, Jerzy Tyszer | 2005-03-29 |
| 6452426 | Circuit for switching between multiple clocks | Ronald Press | 2002-09-17 |
| 6070261 | Multi-phase test point insertion for built-in self test of integrated circuits | Janusz Rajski | 2000-05-30 |
| 5737340 | Multi-phase test point insertion for built-in self test of integrated circuits | Janusz Rajski | 1998-04-07 |