Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12001973 | Machine learning-based adjustments in volume diagnosis procedures for determination of root cause distributions | Gaurav Veda, Wu-Tung Cheng, Manish Sharma, Yue Tian | 2024-06-04 |
| 11227091 | Physical failure analysis-oriented diagnosis resolution prediction | Jakub Janicki | 2022-01-18 |
| 11042679 | Diagnosis resolution prediction | Jakub Janicki | 2021-06-22 |
| 10795751 | Cell-aware diagnostic pattern generation for logic diagnosis | Manish Sharma, Wu-Tung Cheng | 2020-10-06 |
| 10657207 | Inter-cell bridge defect diagnosis | Manish Sharma, Szczepan Urban | 2020-05-19 |
| 10592625 | Cell-aware root cause deconvolution for defect diagnosis and yield analysis | Manish Sharma, Wu-Tung Cheng, Gaurav Veda | 2020-03-17 |
| 10234502 | Circuit defect diagnosis based on sink cell fault models | Manish Sharma, Robert Brady Benware, Wu-Tung Cheng | 2019-03-19 |
| 9857421 | Dynamic design partitioning for diagnosis | Yu Huang, Wu-Tung Cheng, Robert Brady Benware, Xiaoxin Fan | 2018-01-02 |
| 9336107 | Dynamic design partitioning for diagnosis | Yu Huang, Wu-Tung Cheng, Robert Brady Benware, Xiaoxin Fan | 2016-05-10 |
| 9244125 | Dynamic design partitioning for scan chain diagnosis | Yu Huang, Wu-Tung Cheng, Robert Brady Benware, Manish Sharma, Xiaoxin Fan | 2016-01-26 |
| 8812922 | Speeding up defect diagnosis techniques | Wei Zou, Wu-Tung Cheng | 2014-08-19 |
| 8707232 | Fault diagnosis based on design partitioning | Wu-Tung Cheng, Robert Brady Benware, Xiaoxin Fan | 2014-04-22 |
| 8201131 | Generating test patterns having enhanced coverage of untargeted defects | Janusz Rajski, Chen Wang | 2012-06-12 |
| 7987442 | Fault dictionaries for integrated circuit yield and quality analysis methods and systems | Janusz Rajski, Gang Chen, Martin Keim, Nagesh Tamarapalli, Manish Sharma | 2011-07-26 |
| 7512508 | Determining and analyzing integrated circuit yield and quality | Janusz Rajski, Gang Chen, Martin Keim, Nagesh Tamarapalli, Manish Sharma | 2009-03-31 |
| 7509600 | Generating test patterns having enhanced coverage of untargeted defects | Janusz Rajski, Chen Wang | 2009-03-24 |