Issued Patents All Time
Showing 25 most recent of 85 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12001973 | Machine learning-based adjustments in volume diagnosis procedures for determination of root cause distributions | Gaurav Veda, Manish Sharma, Huaxing Tang, Yue Tian | 2024-06-04 |
| 11681843 | Input data compression for machine learning-based chain diagnosis | Yu Huang, Gaurav Veda, Kun-Han Tsai, Mason Chern, Shi-Yu Huang | 2023-06-20 |
| 11635462 | Library cell modeling for transistor-level test pattern generation | Xijiang Lin, Takeo Kobayashi, Andreas Glowatz | 2023-04-25 |
| 11408938 | Bidirectional scan cells for single-path reversible scan chains | Yu Huang | 2022-08-09 |
| 11361248 | Multi-stage machine learning-based chain diagnosis | Yu Huang, Gaurav Veda, Kun-Han Tsai, Mason Chern, Shi-Yu Huang | 2022-06-14 |
| 11320487 | Programmable test compactor for improving defect determination | Chen Wang, Mark Kassab | 2022-05-03 |
| 11156661 | Reversible multi-bit scan cell-based scan chains for improving chain diagnostic resolution | Szczepan Urban, Jakub Janicki, Manish Sharma, Yu Huang | 2021-10-26 |
| 11106848 | Diagnostic resolution enhancement with reversible scan chains | Szczepan Urban, Jakub Janicki, Manish Sharma, Yu Huang | 2021-08-31 |
| 11092645 | Chain testing and diagnosis using two-dimensional scan architecture | Yu Huang | 2021-08-17 |
| 11073556 | Low pin count reversible scan architecture | Yu Huang | 2021-07-27 |
| 11041906 | Optimized scan chain diagnostic pattern generation for reversible scan architecture | Yu Huang, Szczepan Urban, Manish Sharma | 2021-06-22 |
| 11010523 | Prediction of test pattern counts for scan configuration determination | Yu Huang, Janusz Rajski, Mark Kassab | 2021-05-18 |
| 10977400 | Deterministic test pattern generation for designs with timing exceptions | Kun-Han Tsai, Naixing Wang, Chen Wang, Xijiang Lin, Mark Kassab +1 more | 2021-04-13 |
| 10795751 | Cell-aware diagnostic pattern generation for logic diagnosis | Huaxing Tang, Manish Sharma | 2020-10-06 |
| 10592625 | Cell-aware root cause deconvolution for defect diagnosis and yield analysis | Huaxing Tang, Manish Sharma, Gaurav Veda | 2020-03-17 |
| 10496779 | Generating root cause candidates for yield analysis | Robert Brady Benware, Christopher W. Schuermyer, Jonathan James Muirhead, Chen-Yi Chang | 2019-12-03 |
| 10372855 | Scan cell selection for partial scan designs | Xijiang Lin, Ting-Pu Tai, Takeo Kobayashi | 2019-08-06 |
| 10317462 | Wide-range clock signal generation for speed grading of logic cores | Shi-Yu Huang, Kun-Han Tsai, Tzu-Heng Huang | 2019-06-11 |
| 10234502 | Circuit defect diagnosis based on sink cell fault models | Huaxing Tang, Manish Sharma, Robert Brady Benware | 2019-03-19 |
| 10222420 | Transition test generation for detecting cell internal defects | Xijiang Lin, Janusz Rajski | 2019-03-05 |
| 10120024 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Mark Kassab | 2018-11-06 |
| 9977080 | Generating test sets for diagnosing scan chain failures | Ruifeng Guo, Yu Huang | 2018-05-22 |
| 9915702 | Channel sharing for testing circuits having non-identical cores | Yu Huang, Mark Kassab, Janusz Rajski, Jay Babak Jahangiri | 2018-03-13 |
| 9857421 | Dynamic design partitioning for diagnosis | Huaxing Tang, Yu Huang, Robert Brady Benware, Xiaoxin Fan | 2018-01-02 |
| 9778316 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Mark Kassab | 2017-10-03 |