Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10769347 | Predicting no-defect-found physical failure analysis results using Bayesian inference and generalized linear models | — | 2020-09-08 |
| 10496779 | Generating root cause candidates for yield analysis | Robert Brady Benware, Wu-Tung Cheng, Jonathan James Muirhead, Chen-Yi Chang | 2019-12-03 |
| 9703658 | Identifying failure mechanisms based on a population of scan diagnostic reports | Karen Movsisyan | 2017-07-11 |
| 9443051 | Generating root cause candidates for yield analysis | Robert Brady Benware, Wu-Tung Cheng, Jonathan James Muirhead, Chen-Yi Chang | 2016-09-13 |
| 9135103 | Hybrid memory failure bitmap classification | Yu Huang, Wu-Tung Cheng | 2015-09-15 |