Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9703658 | Identifying failure mechanisms based on a population of scan diagnostic reports | Christopher W. Schuermyer | 2017-07-11 |
| 9454149 | Extracting attribute fail rates from convoluted systems | John Kim, Brian S. Gordon, Christophe Suzor | 2016-09-27 |