Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9454149 | Extracting attribute fail rates from convoluted systems | John Kim, Brian S. Gordon, Karen Movsisyan | 2016-09-27 |
| 9292650 | Identifying layout pattern candidates | Brian S. Gordon, Rafik Marutyan, John Kim | 2016-03-22 |