Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9292650 | Identifying layout pattern candidates | Brian S. Gordon, John Kim, Christophe Suzor | 2016-03-22 |
| 7602964 | Method and apparatus for detection of failures in a wafer using transforms and cluster signature analysis | — | 2009-10-13 |