| 10496779 |
Generating root cause candidates for yield analysis |
Wu-Tung Cheng, Christopher W. Schuermyer, Jonathan James Muirhead, Chen-Yi Chang |
2019-12-03 |
| 10234502 |
Circuit defect diagnosis based on sink cell fault models |
Huaxing Tang, Manish Sharma, Wu-Tung Cheng |
2019-03-19 |
| 10198548 |
Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results |
Manish Sharma |
2019-02-05 |
| 9857421 |
Dynamic design partitioning for diagnosis |
Huaxing Tang, Yu Huang, Wu-Tung Cheng, Xiaoxin Fan |
2018-01-02 |
| 9443051 |
Generating root cause candidates for yield analysis |
Wu-Tung Cheng, Christopher W. Schuermyer, Jonathan James Muirhead, Chen-Yi Chang |
2016-09-13 |
| 9378327 |
Canonical forms of layout patterns |
Wu-Tung Cheng, Manish Sharma, Robert R. Klingenberg |
2016-06-28 |
| 9336107 |
Dynamic design partitioning for diagnosis |
Huaxing Tang, Yu Huang, Wu-Tung Cheng, Xiaoxin Fan |
2016-05-10 |
| 9244125 |
Dynamic design partitioning for scan chain diagnosis |
Yu Huang, Huaxing Tang, Wu-Tung Cheng, Manish Sharma, Xiaoxin Fan |
2016-01-26 |
| 9026874 |
Test access mechanism for diagnosis based on partitioning scan chains |
Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Mark Kassab |
2015-05-05 |
| 8930782 |
Root cause distribution determination based on layout aware scan diagnosis results |
— |
2015-01-06 |
| 8707232 |
Fault diagnosis based on design partitioning |
Huaxing Tang, Wu-Tung Cheng, Xiaoxin Fan |
2014-04-22 |
| 8607107 |
Test access mechanism for diagnosis based on partitioining scan chains |
Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Mark Kassab |
2013-12-10 |
| 7617427 |
Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures |
Steven L. Haehn |
2009-11-10 |
| 7395478 |
Method of generating test patterns to efficiently screen inline resistance delay defects in complex asics |
— |
2008-07-01 |
| 7216280 |
Method of generating test patterns to efficiently screen inline resistance delay defects in complex ASICs |
— |
2007-05-08 |
| 7171638 |
Methods of screening ASIC defects using independent component analysis of quiescent current measurements |
Ritesh P. Turakhia |
2007-01-30 |
| 7079963 |
Modified binary search for optimizing efficiency of data collection time |
Cary Gloor, Robert Madge |
2006-07-18 |
| 7058909 |
Method of generating an efficient stuck-at fault and transition delay fault truncated scan test pattern for an integrated circuit design |
Cam Luong Lu, Thai M. Nguyen |
2006-06-06 |
| 6972592 |
Self-timed scan circuit for ASIC fault testing |
— |
2005-12-06 |
| 6954705 |
Method of screening defects using low voltage IDDQ measurement |
— |
2005-10-11 |
