Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10496779 | Generating root cause candidates for yield analysis | Wu-Tung Cheng, Christopher W. Schuermyer, Jonathan James Muirhead, Chen-Yi Chang | 2019-12-03 |
| 10234502 | Circuit defect diagnosis based on sink cell fault models | Huaxing Tang, Manish Sharma, Wu-Tung Cheng | 2019-03-19 |
| 10198548 | Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results | Manish Sharma | 2019-02-05 |
| 9857421 | Dynamic design partitioning for diagnosis | Huaxing Tang, Yu Huang, Wu-Tung Cheng, Xiaoxin Fan | 2018-01-02 |
| 9443051 | Generating root cause candidates for yield analysis | Wu-Tung Cheng, Christopher W. Schuermyer, Jonathan James Muirhead, Chen-Yi Chang | 2016-09-13 |
| 9378327 | Canonical forms of layout patterns | Wu-Tung Cheng, Manish Sharma, Robert R. Klingenberg | 2016-06-28 |
| 9336107 | Dynamic design partitioning for diagnosis | Huaxing Tang, Yu Huang, Wu-Tung Cheng, Xiaoxin Fan | 2016-05-10 |
| 9244125 | Dynamic design partitioning for scan chain diagnosis | Yu Huang, Huaxing Tang, Wu-Tung Cheng, Manish Sharma, Xiaoxin Fan | 2016-01-26 |
| 9026874 | Test access mechanism for diagnosis based on partitioning scan chains | Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Mark Kassab | 2015-05-05 |
| 8930782 | Root cause distribution determination based on layout aware scan diagnosis results | — | 2015-01-06 |
| 8707232 | Fault diagnosis based on design partitioning | Huaxing Tang, Wu-Tung Cheng, Xiaoxin Fan | 2014-04-22 |
| 8607107 | Test access mechanism for diagnosis based on partitioining scan chains | Wu-Tung Cheng, Manish Sharma, Avijit Dutta, Mark Kassab | 2013-12-10 |
| 7617427 | Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures | Steven L. Haehn | 2009-11-10 |
| 7395478 | Method of generating test patterns to efficiently screen inline resistance delay defects in complex asics | — | 2008-07-01 |
| 7216280 | Method of generating test patterns to efficiently screen inline resistance delay defects in complex ASICs | — | 2007-05-08 |
| 7171638 | Methods of screening ASIC defects using independent component analysis of quiescent current measurements | Ritesh P. Turakhia | 2007-01-30 |
| 7079963 | Modified binary search for optimizing efficiency of data collection time | Cary Gloor, Robert Madge | 2006-07-18 |
| 7058909 | Method of generating an efficient stuck-at fault and transition delay fault truncated scan test pattern for an integrated circuit design | Cam Luong Lu, Thai M. Nguyen | 2006-06-06 |
| 6972592 | Self-timed scan circuit for ASIC fault testing | — | 2005-12-06 |
| 6954705 | Method of screening defects using low voltage IDDQ measurement | — | 2005-10-11 |