Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7617427 | Method and apparatus for detecting defects in integrated circuit die from stimulation of statistical outlier signatures | Robert Brady Benware | 2009-11-10 |
| 7603637 | Secure, stable on chip silicon identification | — | 2009-10-13 |
| 6825688 | System for yield enhancement in programmable logic | — | 2004-11-30 |
| 6623992 | System and method for determining a subthreshold leakage test limit of an integrated circuit | Christopher D. Macchietto, Mitchel E. Lohr | 2003-09-23 |
| 6261870 | Backside failure analysis capable integrated circuit packaging | William Harmon | 2001-07-17 |
| 6091652 | Testing semiconductor devices for data retention | James P. Yakura | 2000-07-18 |