Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8352818 | Method for generating test patterns for small delay defects | Sandeep Kumar Goel, Narendra Devta-Prasanna | 2013-01-08 |
| 7171638 | Methods of screening ASIC defects using independent component analysis of quiescent current measurements | Robert Brady Benware | 2007-01-30 |